Inventor · disambiguated record
Kumiko Kamihara
Also filed as: KAMIHARA KUMIKO
16 granted patents·2 pending applications·27 citations·filing 2005–2017
88Inventor score
Top patents by PatentIndex Score
18 records- 0185US9476893B2Automatic analysis device and analysis methodMITSUYAMA SATOSHI·Filed 2010·Granted Oct 25, 2016·8 cites·18 claims
- 0284US10288637B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2015·Granted May 14, 2019·3 cites·10 claims
- 0379US9310388B2Automatic analyzer and analysis methodKAMIHARA KUMIKO·Filed 2010·Granted Apr 12, 2016·4 cites·10 claims
- 0478US9335335B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2013·Granted May 10, 2016·3 cites·6 claims
- 0573US9857388B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 2, 2018·2 cites·3 claims
- 0668US9470570B2Automatic analyzer and method for determining malfunction thereofNISHIDA MASAHARU·Filed 2012·Granted Oct 18, 2016·2 cites·11 claims
- 0766US8150645B2Automatic analzyerKAMIHARA KUMIKO·Filed 2009·Granted Apr 3, 2012·4 cites·6 claims
- 0860US11280733B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2017·Granted Mar 22, 2022·0 cites·3 claims
- 0957US9383376B2Automatic analyzerKAMIHARA KUMIKO·Filed 2009·Granted Jul 5, 2016·1 cites·9 claims
- 1052US2013266484A1Automatic analyzerKAMIHARA KUMIKO·Filed 2011·Application pending·0 cites
- 1146US9897624B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 20, 2018·0 cites·5 claims
- 1245US9562917B2Automatic analysis device and automatic analysis programMANRI CHIHIRO·Filed 2012·Granted Feb 7, 2017·0 cites·11 claims
- 1344US9841413B2Data processing device and automatic analysis device using sameHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 12, 2017·0 cites·3 claims
- 1440US10203277B2Automatic analysis device and automatic analysis methodMANRI CHIHIRO·Filed 2011·Granted Feb 12, 2019·0 cites·12 claims
- 1540US9488667B2Automatic analyzerKAMIHARA KUMIKO·Filed 2010·Granted Nov 8, 2016·0 cites·22 claims
- 1639US9599631B2Automatic analyzerYAMAZAKI ISAO·Filed 2012·Granted Mar 21, 2017·0 cites·14 claims
- 1739US2005282207A1Method of stress evaluationROKUTAN KAZUHITO·Filed 2005·Application pending·0 cites
- 1838US10352864B2Automatic analyzer for identifying a cause of abnormalities of measurement resultsKAMIHARA KUMIKO·Filed 2011·Granted Jul 16, 2019·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →