Inventor · disambiguated record
Yi Feng Lee
Also filed as: LEE YI FENG
7 granted patents·5 pending applications·11 citations·filing 2008–2010
76Inventor score
Top patents by PatentIndex Score
12 records- 0176US8032248B2Method for finding the correlation between the tool PM and the product yieldINOTERA MEMORIES INC·Filed 2009·Granted Oct 4, 2011·5 cites·10 claims
- 0261US7855086B2Method for monitoring fabrication parameterINOTERA MEMORIES INC·Filed 2009·Granted Dec 21, 2010·1 cites·18 claims
- 0355US8195431B2Method for evaluating efficacy of prevention maintenance for a toolLEE YI FENG·Filed 2009·Granted Jun 5, 2012·0 cites·13 claims
- 0450US8244500B2Method of adjusting wafer processing sequenceTIAN YUN-ZONG·Filed 2009·Granted Aug 14, 2012·2 cites·12 claims
- 0550US8090668B2Method for predicting cycle timeLEE YI FENG·Filed 2008·Granted Jan 3, 2012·2 cites·19 claims
- 0645US2009276182A1Machine fault detection methodINOTERA MEMORIES INC·Filed 2008·Application pending·0 cites
- 0744US8170964B2Method for planning a semiconductor manufacturing process based on users' demands using a fuzzy system and a genetic algorithm modelChen wei jun·Filed 2009·Granted May 1, 2012·1 cites·18 claims
- 0844US2010010763A1Method for detecting variance in semiconductor processesINOTERA MEMORIES INC·Filed 2008·Application pending·0 cites
- 0944US2009197354A1System and method for monitoring manufacturing processINOTERA MEMORIES INC·Filed 2008·Application pending·0 cites
- 1042US8010212B2Fuzzy control method for adjusting a semiconductor machineINOTERA MEMORIES INC·Filed 2008·Granted Aug 30, 2011·0 cites·22 claims
- 1140US2011251708A1Method for planning production schedule of equipment and associated computer readable mediumCHEN WEI-JUN·Filed 2010·Application pending·0 cites
- 1233US2011112999A1Method for predicting and warning of wafer acceptance test valueINOTERA MEMORIES INC·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →