Inventor · disambiguated record
Sang Gil Park
Also filed as: PARK SANG GIL
4 granted patents·7 pending applications·23 citations·filing 2006–2024
68Inventor score
Files withGAUSS LABS INC2SAMSUNG ELECTRONICS CO LTD2INNISFREE CORP1KOREA ADVANCED INST SCI & TECH1KOREA ELECTRONICS TELECOMM1
Top patents by PatentIndex Score
11 records- 0181US9772476B2Gradient index lens using effective refractive index of microstructure arranged in radial pattern, and method for manufacturing sameKOREA ADVANCED INST SCI & TECH·Filed 2012·Granted Sep 26, 2017·7 cites·11 claims
- 0275US7819117B2Emergency oxygen maskSUN YANG TECH CO LTD·Filed 2006·Granted Oct 26, 2010·16 cites·10 claims
- 0355US2025014152A1Systems and methods for denoising image dataGAUSS LABS INC·Filed 2024·Application pending·0 cites
- 0455US2021177122A1Eyebrow stampINNISFREE CORP·Filed 2019·Application pending·0 cites
- 0555US2023309563A1Antibacterial composite with instant sterilization capability, and preparation method thereforOSANGJAIEL CO LTD·Filed 2021·Application pending·0 cites
- 0655US2025013341A1Systems and methods for determining and quantifying image dataGAUSS LABS INC·Filed 2024·Application pending·0 cites
- 0747US2024178431A1Method and apparatus for controlling separator tension of laminated plates of secondary batteryMPLUS CORP·Filed 2022·Application pending·0 cites
- 0843US11225197B2Roof rack for vehicleLG HAUSYS LTD·Filed 2018·Granted Jan 18, 2022·0 cites·8 claims
- 0942US2008134283A1Security apparatus and method for supporting IPv4 and IPv6KOREA ELECTRONICS TELECOMM·Filed 2007·Application pending·0 cites
- 1040US10473579B2Apparatus for inspecting material property of plurality of measurement objectsSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 12, 2019·0 cites·14 claims
- 1135US2019094072A1Atomic emission spectrometer based on laser-induced plasma (lip), semiconductor manufacturing facility including the atomic emission spectrometer, and method of manufacturing semiconductor device using the atomic emission spectrometerSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →