Inventor · disambiguated record
Mehdi Balooch
Also filed as: BALOOCH MEHDI
18 granted patents·7 pending applications·374 citations·filing 1986–2025
95Inventor score
Top patents by PatentIndex Score
25 records- 0188US5461907AImaging, cutting, and collecting instrument and methodUNIV CALIFORNIA·Filed 1993·Granted Oct 31, 1995·90 cites·24 claims
- 0285US6120857ALow work function surface layers produced by laser ablation using short-wavelength photonsUNIV CALIFORNIA·Filed 1998·Granted Sep 19, 2000·59 cites·17 claims
- 0383US8454409B2CO2 nozzlesBOWERS CHARLES W·Filed 2009·Granted Jun 4, 2013·12 cites·23 claims
- 0481US4774416ALarge cross-sectional area molecular beam source for semiconductor processingPLASER CORP·Filed 1986·Granted Sep 27, 1988·33 cites·36 claims
- 0578US5747120ALaser ablated hard coating for microtoolsUNIV CALIFORNIA·Filed 1997·Granted May 5, 1998·49 cites·16 claims
- 0677US7349103B1System and method for high intensity small spot optical metrologyN & K TECHNOLOGY INC·Filed 2005·Granted Mar 25, 2008·10 cites·30 claims
- 0774US8801504B2CO2 nozzlesRAVE N P INC·Filed 2013·Granted Aug 12, 2014·3 cites·24 claims
- 0873US5861346AProcess for forming silicon carbide films and microcomponentsUNIV CALIFORNIA·Filed 1995·Granted Jan 19, 1999·28 cites·19 claims
- 0972US8329046B2Methods for damage etch and texturing of silicon single crystal substratesDOVE CURTIS·Filed 2009·Granted Dec 11, 2012·5 cites·9 claims
- 1069US6162707ALow work function, stable thin filmsUNIV CALIFORNIA·Filed 1998·Granted Dec 19, 2000·35 cites·9 claims
- 1167US10245623B2Contamination removal apparatus and methodRAVE N P INC·Filed 2013·Granted Apr 2, 2019·2 cites·21 claims
- 1264US7397030B1Integrated local and global optical metrology for samples having miniature featuresN & K TECHNOLOGY INC·Filed 2006·Granted Jul 8, 2008·3 cites·46 claims
- 1363US5019552ALong-laser-pulse method of producing thin filmsUS ENERGY·Filed 1990·Granted May 28, 1991·26 cites·25 claims
- 1463US2025093299A1Corrosion-resistant acoustic resonance sensor devices for radical species detectionAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1560US7118630B1Apparatus for depositing a low work function materialUNIV CALIFORNIA·Filed 2000·Granted Oct 10, 2006·4 cites·9 claims
- 1659US2025098541A1Acoustic resonance sensor devices for radical species detection with enhanced filtersAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1758US2023375506A1Sensor for measurement of radicalsAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1857US2025316454A1Remote plasma sourcesAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1949US11135626B2Contamination removal apparatus and methodBRUKER NANO INC·Filed 2017·Granted Oct 5, 2021·0 cites·6 claims
- 2044US6235615B1Generation of low work function, stable compound thin films by laser ablationUNIV CALIFORNIA·Filed 2000·Granted May 22, 2001·6 cites·9 claims
- 2142US2011180132A1Texturing and damage etch of silicon single crystal (100) substratesDOVE CURTIS·Filed 2010·Application pending·0 cites
- 2239US6019913ALow work function, stable compound clusters and generation processUNIV CALIFORNIA·Filed 1998·Granted Feb 1, 2000·7 cites·19 claims
- 2333US6351254B2Junction-based field emission structure for field emission displayUNIV CALIFORNIA·Filed 1998·Granted Feb 26, 2002·2 cites·18 claims
- 2433US2012279519A1Integrated Substrate Cleaning System and MethodSWANSON GORDON SCOTT·Filed 2011·Application pending·0 cites
- 2533US2004129063A1Method for performing nanoscale dynamics imaging by atomic force microscopyFiled 2003·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →