Inventor · disambiguated record
Shinsaku Abe
Also filed as: ABE SHINSAKU
21 granted patents·3 pending applications·15 citations·filing 2013–2023
90Inventor score
Files withMITUTOYO CORP24
Top patents by PatentIndex Score
24 records- 0181US9651370B2Manual measuring systemMITUTOYO CORP·Filed 2015·Granted May 16, 2017·3 cites·9 claims
- 0273US9267780B2Three-dimensional shape measurement system and software for controlling the sameMITUTOYO CORP·Filed 2014·Granted Feb 23, 2016·3 cites·10 claims
- 0373US9109868B2Method and program for using gestures to control a coordinate measuring deviceMITUTOYO CORP·Filed 2013·Granted Aug 18, 2015·3 cites·16 claims
- 0470US11092423B2Measuring device and measuring systemMITUTOYO CORP·Filed 2018·Granted Aug 17, 2021·1 cites·14 claims
- 0570US10825216B2Apparatus for reading value measured with analog measuring toolMITUTOYO CORP·Filed 2018·Granted Nov 3, 2020·1 cites·7 claims
- 0665US9377283B2Method and program for using gestures to control a coordinate measuring deviceMITUTOYO CORP·Filed 2014·Granted Jun 28, 2016·2 cites·6 claims
- 0762US11715260B2Offline teaching device, measurement control device, and programMITUTOYO CORP·Filed 2021·Granted Aug 1, 2023·0 cites·5 claims
- 0861US10890443B2Roundness measuring device, measurement guide system, and measurement guide methodMITUTOYO CORP·Filed 2019·Granted Jan 12, 2021·1 cites·11 claims
- 0961US10359279B2Remote controllable measuring apparatus and measuring systemMITUTOYO CORP·Filed 2015·Granted Jul 23, 2019·1 cites·10 claims
- 1056US10066922B2Manual measuring systemMITUTOYO CORP·Filed 2016·Granted Sep 4, 2018·0 cites·8 claims
- 1153US11630436B2Measurement program selection assisting apparatus and measurement control apparatusMITUTOYO CORP·Filed 2019·Granted Apr 18, 2023·0 cites·4 claims
- 1253US11189086B2Offline teaching device, measurement control device, and programMITUTOYO CORP·Filed 2019·Granted Nov 30, 2021·0 cites·4 claims
- 1352US9395169B2Multi-axis type three-dimensional measuring apparatusMITUTOYO CORP·Filed 2014·Granted Jul 19, 2016·0 cites·16 claims
- 1451US11262179B2Surface texture measuring device, surface texture measuring system, and programMITUTOYO CORP·Filed 2018·Granted Mar 1, 2022·0 cites·13 claims
- 1551US10690474B2Operation method of position measuring deviceMITUTOYO CORP·Filed 2018·Granted Jun 23, 2020·0 cites·10 claims
- 1649US10845603B2Imaging assisting device and programMITUTOYO CORP·Filed 2019·Granted Nov 24, 2020·0 cites·6 claims
- 1749US2023214083A1Measurement program selection assisting apparatus and measurement control apparatusMITUTOYO CORP·Filed 2023·Application pending·0 cites
- 1848US11132549B2Measurement result display apparatus and programMITUTOYO CORP·Filed 2020·Granted Sep 28, 2021·0 cites·7 claims
- 1948US10883862B2Measurement-data collecting apparatus and computer programMITUTOYO CORP·Filed 2018·Granted Jan 5, 2021·0 cites·8 claims
- 2047US11222481B2Visualization apparatus and programMITUTOYO CORP·Filed 2020·Granted Jan 11, 2022·0 cites·9 claims
- 2147US10853652B2Measurement data collection device and programMITUTOYO CORP·Filed 2019·Granted Dec 1, 2020·0 cites·9 claims
- 2245US2019355281A1Learning support system and recording mediumMITUTOYO CORP·Filed 2019·Application pending·0 cites
- 2345US2019370954A1Measurement information integrating device and programMITUTOYO CORP·Filed 2019·Application pending·0 cites
- 2443US10678430B2Terminal device and programMITUTOYO CORP·Filed 2018·Granted Jun 9, 2020·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →