Inventor · disambiguated record
Min-Hung Chang
Also filed as: CHANG MIN-HUNG
5 granted patents·2 pending applications·15 citations·filing 2008–2025
69Inventor score
Top patents by PatentIndex Score
7 records- 0188US11841381B2Wafer inspection method and inspection apparatusCHROMA ATE INC·Filed 2022·Granted Dec 12, 2023·1 cites·19 claims
- 0283US7804589B2System and method for testing light-emitting devicesCHROMA ATE INC·Filed 2009·Granted Sep 28, 2010·14 cites·3 claims
- 0383US2025298057A1Wafer inspection apparatusCHROMA ATE INC·Filed 2025·Application pending·0 cites
- 0474US12345741B2Wafer inspection method and inspection apparatusCHROMA ATE INC·Filed 2022·Granted Jul 1, 2025·0 cites·3 claims
- 0545US11047550B1Electronic deviceASUSTEK COMP INC·Filed 2020·Granted Jun 29, 2021·0 cites·9 claims
- 0641US2009086113A1Touch panel and touch liquid crystal display using the sameCHUNGHWA PICTURE TUBES LTD·Filed 2008·Application pending·0 cites
- 0740US11573265B2Electrical component testing method and test probeCHANG MIN HUNG·Filed 2020·Granted Feb 7, 2023·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →