Inventor · disambiguated record
Ching-Huang Wang
Also filed as: WANG CHING-HUANG
25 granted patents·6 pending applications·41 citations·filing 2001–2025
93Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD23TAIWAN SEMICONDUCTOR MFG2TATUNG CO2WANG CHING-YUAN2CHEN C WILL1
Top patents by PatentIndex Score
31 records- 0190US11429482B2Systems and methods for correcting data errors in memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Aug 30, 2022·2 cites·20 claims
- 0287US9335365B2Split gate structure and method of using sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 10, 2016·6 cites·20 claims
- 0383US2025356898A1Magnetoresistive Random-Access Memory (MRAM) Cell and Method of Operation ThereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0481US12191262B2Package structure and method for fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 7, 2025·0 cites·20 claims
- 0580US10665321B2Method for testing MRAM device and test apparatus thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted May 26, 2020·5 cites·20 claims
- 0679US11719742B2Semiconductor wafer testing system and related method for improving external magnetic field wafer testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 8, 2023·0 cites·20 claims
- 0778US11749617B2Package structure and method for fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 5, 2023·0 cites·20 claims
- 0877US12210055B2Semiconductor wafer testing system and related method for improving external magnetic field wafer testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 28, 2025·0 cites·20 claims
- 0975US10877089B2Semiconductor wafer testing system and related method for improving external magnetic field wafer testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 29, 2020·2 cites·20 claims
- 1074US10936413B2Systems and methods for correcting data errors in memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Mar 2, 2021·2 cites·20 claims
- 1173US11755410B2Systems and methods for correcting data errors in memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 12, 2023·0 cites·20 claims
- 1272US2024339144A1Magnetoresistive Random-Access Memory (MRAM) Cell and Method of Operation ThereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1371US11380626B2Package structure and method for fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jul 5, 2022·0 cites·20 claims
- 1470US10228998B2Systems and methods for correcting data errors in memory susceptible to data loss when subjected to elevated temperaturesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 12, 2019·2 cites·17 claims
- 1569US11726747B2Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 15, 2023·0 cites·20 claims
- 1668US11506706B2Semiconductor wafer testing system and related method for improving external magnetic field wafer testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Nov 22, 2022·0 cites·20 claims
- 1768US10047194B2Biodegradable polyesterTATUNG CO·Filed 2013·Granted Aug 14, 2018·1 cites·3 claims
- 1865US8110380B2Starch-based biodegradable material compositionCHEN C WILL·Filed 2008·Granted Feb 7, 2012·2 cites·20 claims
- 1962US9063192B2Split gate structure and method of using sameHUANG YEN-CHIEH·Filed 2011·Granted Jun 23, 2015·2 cites·19 claims
- 2060US10818609B2Package structure and method for fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Oct 27, 2020·0 cites·20 claims
- 2158US11249131B2Test apparatus and testing method using the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 15, 2022·0 cites·20 claims
- 2257US11531524B2Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 20, 2022·0 cites·20 claims
- 2357US2024096818A1Shielding for reducing electromagnetic interference and magnetic interference and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2456US2023371275A1Method of forming different types of memory devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Application pending·0 cites
- 2555US6842381B2Method of marginal erasure for the testing of flash memoriesTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Jan 11, 2005·8 cites·26 claims
- 2654US11276649B2Devices and methods having magnetic shielding layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Mar 15, 2022·0 cites·20 claims
- 2754US10128313B2Non-volatile memory device and structure thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Nov 13, 2018·1 cites·20 claims
- 2854US6396740B1Reference cell circuit for split gate flash memoryTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted May 28, 2002·8 cites·18 claims
- 2953US11326052B2Biodegradable plastic composition and manufacturing method thereofTATUNG CO·Filed 2020·Granted May 10, 2022·0 cites·16 claims
- 3045US2008139121A1Communication device for connecting a blue tooth handset to an indoor phoneWANG CHING YUAN·Filed 2006·Application pending·0 cites
- 3145US2008139255A1Blue tooth hand free transmission assemblyWANG CHING YUAN·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Ching-Huang Wang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →