Inventor · disambiguated record
Nicholas John Weston
Also filed as: WESTON NICHOLAS J · WESTON NICHOLAS JOHN
25 granted patents·8 pending applications·275 citations·filing 2001–2021
96Inventor score
Files withRENISHAW PLC22WESTON NICHOLAS JOHN6JONAS KEVYN BARRY1MCFARLAND GEOFFREY1MCKENDRICK ALEXANDER DAVID1
Top patents by PatentIndex Score
33 records- 0195US10399145B2Additive manufacturing apparatus and methodRENISHAW PLC·Filed 2014·Granted Sep 3, 2019·17 cites·23 claims
- 0295US8006398B2Method for scanning the surface of a workpieceRENISHAW PLC·Filed 2006·Granted Aug 30, 2011·42 cites·24 claims
- 0390US8923603B2Non-contact measurement apparatus and methodWESTON NICHOLAS JOHN·Filed 2008·Granted Dec 30, 2014·22 cites·31 claims
- 0490US8001859B2Method of error compensation in a coordinate measuring machineRENISHAW PLC·Filed 2009·Granted Aug 23, 2011·18 cites·14 claims
- 0589US8474148B2Articulating probe head apparatus and methodJONAS KEVYN BARRY·Filed 2010·Granted Jul 2, 2013·11 cites·30 claims
- 0689US7861430B2Articulating probe head apparatus and methodRENISHAW PLC·Filed 2007·Granted Jan 4, 2011·20 cites·7 claims
- 0787US8978261B2Probe head for scanning the surface of a workpieceMCFARLAND GEOFFREY·Filed 2011·Granted Mar 17, 2015·11 cites·12 claims
- 0887US7286949B2Method of error correctionRENISHAW PLC·Filed 2006·Granted Oct 23, 2007·19 cites·19 claims
- 0986US8939008B2Calibration artefact for calibrating an articulating probe headMCMURTRY DAVID ROBERTS·Filed 2011·Granted Jan 27, 2015·7 cites·13 claims
- 1084US11123799B2Additive manufacturing apparatus and methodRENISHAW PLC·Filed 2019·Granted Sep 21, 2021·1 cites·10 claims
- 1184US9038282B2Interchangeable task module counterweightMCMURTRY DAVID R·Filed 2011·Granted May 26, 2015·10 cites·27 claims
- 1284US8605983B2Non-contact probeWESTON NICHOLAS JOHN·Filed 2008·Granted Dec 10, 2013·12 cites·17 claims
- 1384US7568373B2Method of error compensation in a coordinate measuring machineRENISHAW PLC·Filed 2004·Granted Aug 4, 2009·23 cites·18 claims
- 1477US7908759B2Method for scanning the surface of a workpieceRENISHAW PLC·Filed 2006·Granted Mar 22, 2011·10 cites·20 claims
- 1577US7456538B2Reaction balanced rotary drive mechanismRENISHAW PLC·Filed 2002·Granted Nov 25, 2008·22 cites·17 claims
- 1675US11105607B2Non-contact probe and method of operationRENISHAW PLC·Filed 2017·Granted Aug 31, 2021·2 cites·24 claims
- 1766US7891109B2Contact sensing probeRENISHAW PLC·Filed 2007·Granted Feb 22, 2011·6 cites·21 claims
- 1864US9329030B2Non-contact object inspectionWESTON NICHOLAS JOHN·Filed 2010·Granted May 3, 2016·2 cites·29 claims
- 1963US6633143B2Reactionless rotary drive mechanismRENISHAW PLC·Filed 2001·Granted Oct 14, 2003·11 cites·7 claims
- 2061US7856731B2Contact sensing probeRENISHAW PLC·Filed 2007·Granted Dec 28, 2010·3 cites·22 claims
- 2157USRE46012ENon-contact probeRENISHAW PLC·Filed 2008·Granted May 24, 2016·1 cites·36 claims
- 2257US8792707B2Phase analysis measurement apparatus and methodWESTON NICHOLAS JOHN·Filed 2008·Granted Jul 29, 2014·2 cites·16 claims
- 2355US2021229215A1Laser beam scannerRENISHAW PLC·Filed 2019·Application pending·0 cites
- 2455US2024012143A1Apparatus and method for distance metrologyRENISHAW PLC·Filed 2021·Application pending·0 cites
- 2554US9618329B2Optical inspection probeWESTON NICHOLAS JOHN·Filed 2009·Granted Apr 11, 2017·3 cites·33 claims
- 2652US9945697B2Measurement scale with periodic nanostructureRENISHAW PLC·Filed 2014·Granted Apr 17, 2018·0 cites·36 claims
- 2740US10226840B2Method of forming an optical deviceWESTON NICHOLAS JOHN·Filed 2011·Granted Mar 12, 2019·0 cites·38 claims
- 2839US2015339505A1Method of reading dataRENISHAW PLC·Filed 2014·Application pending·0 cites
- 2937US2011273702A1Optical measuring method and systemRENISHAW PLC·Filed 2010·Application pending·0 cites
- 3036US2010072456A1Opto-electronic read headRENISHAW PLC·Filed 2007·Application pending·0 cites
- 3136US2009320553A1Surface Measurement ProbeRENISHAW PLC·Filed 2007·Application pending·0 cites
- 3236US2020233377A1Marking method and systemRENISHAW PLC·Filed 2018·Application pending·0 cites
- 3329US2012072170A1Vision measurement probe and method of operationMCKENDRICK ALEXANDER DAVID·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →