Inventor · disambiguated record
Seonghyun Kang
Also filed as: KANG SEONGHYUN
1 granted patent·1 pending application·0 citations·filing 2022–2025
13Inventor score
Technology areasG01R
Files withJCET STATS CHIPPAC KOREA LTD2
Top patents by PatentIndex Score
2 records- 0175US2025383399A1Semiconductor Test Equipment and Method of Performing Current and Voltage Test MeasurementsJCET STATS CHIPPAC KOREA LTD·Filed 2025·Application pending·0 cites
- 0264US12379413B2Semiconductor test equipment and method of performing current and voltage test measurementsJCET STATS CHIPPAC KOREA LTD·Filed 2022·Granted Aug 5, 2025·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →