Inventor · disambiguated record
Chao-Nan Chen
Also filed as: CHEN CHAO · CHEN CHAO-NAN
15 granted patents·9 pending applications·46 citations·filing 2007–2025
90Inventor score
Files withUNITED MICROELECTRONICS CORP9YUAN KUO-HUA3IND TECH RES INST2JMICRON TECHNOLOGY CORP2CHEN CHAO-NAN1
Top patents by PatentIndex Score
24 records- 0195US11545560B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2021·Granted Jan 3, 2023·4 cites·9 claims
- 0289US10943991B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2019·Granted Mar 9, 2021·4 cites·8 claims
- 0389US8773757B2Slit-scan multi-wavelength confocal lens module and slit-scan microscopic system and method using the sameCHEN LIANG-CHIA·Filed 2010·Granted Jul 8, 2014·15 cites·12 claims
- 0485US10079180B1Method of forming a semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Sep 18, 2018·5 cites·19 claims
- 0584US12300743B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Granted May 13, 2025·0 cites·7 claims
- 0680US2025241038A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 0778US12021134B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2022·Granted Jun 25, 2024·0 cites·14 claims
- 0875US10345568B2Mueller-matrix microscope and measurement and calibration methods using the sameWUHAN EOPTICS TECH CO LTD·Filed 2017·Granted Jul 9, 2019·4 cites·9 claims
- 0975US2025072060A1Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1068US12402367B2Semiconductor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2022·Granted Aug 26, 2025·0 cites·14 claims
- 1168US8060687B2Flash memory allocating methodYUAN KUO-HUA·Filed 2008·Granted Nov 15, 2011·8 cites·6 claims
- 1258US8222095B2Method for fabricating thin film transistorLUO FANG-CHEN·Filed 2008·Granted Jul 17, 2012·2 cites·20 claims
- 1357US9059745B2Error checking and correction method applied in a multi-channel system and related circuitJMICRON TECHNOLOGY CORP·Filed 2013·Granted Jun 16, 2015·2 cites·18 claims
- 1453US10700202B2Semiconductor device and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jun 30, 2020·0 cites·20 claims
- 1548US7885666B2Method and apparatus for determining the new sample points of the location determination system in a wireless environmentIND TECH RES INST·Filed 2007·Granted Feb 8, 2011·2 cites·11 claims
- 1646US2021073896A1Product order prediction methodINVENTEC PUDONG TECH CORP·Filed 2019·Application pending·0 cites
- 1745US10749643B2Waveform observation system and method for waveform observationDENSO CORP·Filed 2016·Granted Aug 18, 2020·0 cites·13 claims
- 1845US2011113185A1Memory apparatus and memory controller for accessing non-volatile memoryYUAN KUO-HUA·Filed 2009·Application pending·0 cites
- 1938US7970575B2Method and apparatus for determining accuracy of the estimated location for a target in a wireless systemIND TECH RES INST·Filed 2008·Granted Jun 28, 2011·0 cites·20 claims
- 2038US2012066560A1Access method of volatile memory and access apparatus of volatile memoryCHUANG HAI-FENG·Filed 2011·Application pending·0 cites
- 2135US2011173376A1Cache apparatus for increasing data accessing speed of storage deviceYUAN KUO-HUA·Filed 2010·Application pending·0 cites
- 2234US2014122964A1Error checking and correction method for determining an error correction code length and related error checking and correction circuitJMICRON TECHNOLOGY CORP·Filed 2013·Application pending·0 cites
- 2332US2008154542A1Method And Apparatus For Determining The Confidence Index Of The Estimated Location For A Target Device In A Wireless SystemHSYU MING-CHUN·Filed 2007·Application pending·0 cites
- 2431US2009210603A1Flash memory circuit with combinational interfaceCHEN CHAO-NAN·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →