Inventor · disambiguated record
Martin Schnell
Also filed as: SCHNELL MARTIN
14 granted patents·4 pending applications·104 citations·filing 1990–2020
91Inventor score
Files withINFINEON TECHNOLOGIES AG6QIMONDA AG3ASOCIACION CENTRO DE INVESTIG COOPERATIVA EN NANOSCIENCIAS CIC NANOGUNE1ASOCIACIÓN CT DE INVESTIGACIÓN COOPERATIVA EN NANOCIENCIAS CIC NANOGUNE1FLACH BJORN1
Top patents by PatentIndex Score
18 records- 0189US10538078B2Cylinder having a partially gas-permeable surfaceFLINT GROUP GERMANY GMBH·Filed 2017·Granted Jan 21, 2020·3 cites·17 claims
- 0288US7760569B2Semiconductor memory device with temperature controlQIMONDA AG·Filed 2007·Granted Jul 20, 2010·28 cites·20 claims
- 0377US11493323B2Infrared-optical hybrid imaging technology for all-digital histopathologyUNIV ILLINOIS·Filed 2020·Granted Nov 8, 2022·1 cites·60 claims
- 0477US9213313B2Synthetic optical holographyASOCIACIÓN CT DE INVESTIGACIÓN COOPERATIVA EN NANOCIENCIAS CIC NANOGUNE·Filed 2013·Granted Dec 15, 2015·4 cites·58 claims
- 0571US10295560B2Near field optical microscope for acquiring spectraASOCIACION CENTRO DE INVESTIG COOPERATIVA EN NANOSCIENCIAS CIC NANOGUNE·Filed 2016·Granted May 21, 2019·2 cites·15 claims
- 0671US7221617B2Backwards-compatible memory moduleINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 22, 2007·10 cites·37 claims
- 0765US5060538AGear shift mechanism for a manual automotive transmissionFORD MOTOR CO·Filed 1990·Granted Oct 29, 1991·23 cites·8 claims
- 0863US7360139B2Semiconductor component, arrangement and method for characterizing a tester for semiconductor componentsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 15, 2008·7 cites·27 claims
- 0961US6777924B2Method and magazine device for testing semiconductor devicesINFINEON TECHNOLOGIES AG·Filed 2003·Granted Aug 17, 2004·12 cites·21 claims
- 1060US6947303B2Memory chip, memory component and corresponding memory module and methodINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 20, 2005·11 cites·5 claims
- 1155US7414421B2Insertable calibration deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Aug 19, 2008·3 cites·19 claims
- 1241US2005055618A1Test arrangement and method for selecting a test mode output channelFiled 2004·Application pending·0 cites
- 1340US2007176255A1Integrated circuit arrangementKREUPL FRANZ·Filed 2006·Application pending·0 cites
- 1438US7757145B2Test method, integrated circuit and test systemQIMONDA AG·Filed 2008·Granted Jul 13, 2010·0 cites·20 claims
- 1537US2009051383A1Test Method and Production Method for a Semiconductor Circuit Composed of SubcircuitsQIMONDA AG·Filed 2005·Application pending·0 cites
- 1633US9667890B2Method for visualizing spatially-resolved measurement results and corresponding measuring arrangementSCHNELL MARTIN·Filed 2010·Granted May 30, 2017·0 cites·12 claims
- 1733US2006181300A1Method for testing a circuit unit and test apparatusFLACH BJORN·Filed 2006·Application pending·0 cites
- 1832US7426669B2Circuit arrangement and method for driving electronic chipsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Sep 16, 2008·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →