Inventor · disambiguated record
Milos Toth
Also filed as: TOTH MILOS
28 granted patents·3 pending applications·155 citations·filing 2007–2024
96Inventor score
Top patents by PatentIndex Score
31 records- 0196US8524139B2Gas-assisted laser ablationTOTH MILOS·Filed 2010·Granted Sep 3, 2013·27 cites·21 claims
- 0294US8168961B2Charged particle beam masking for laser ablation micromachiningSTRAW MARCUS·Filed 2008·Granted May 1, 2012·20 cites·21 claims
- 0392US12061159B2Particle-induced x-ray emission (PIXE) using hydrogen and multi-species focused ion beamsFEI CO·Filed 2022·Granted Aug 13, 2024·2 cites·28 claims
- 0492US8853078B2Method of depositing materialBOTMAN AURELIEN PHILIPPE JEAN MACLOU·Filed 2011·Granted Oct 7, 2014·9 cites·26 claims
- 0591US8357894B2Microcalorimetry for X-ray spectroscopyFEI CO·Filed 2010·Granted Jan 22, 2013·18 cites·21 claims
- 0690US11152189B2Method and system for plasma assisted low vacuum charged-particle microscopyFEI CO·Filed 2020·Granted Oct 19, 2021·4 cites·20 claims
- 0790US7541580B2Detector for charged particle beam instrumentFEI CO·Filed 2007·Granted Jun 2, 2009·15 cites·31 claims
- 0889US8617668B2Method of using nitrogen based compounds to reduce contamination in beam-induced thin film depositionTOTH MILOS·Filed 2009·Granted Dec 31, 2013·11 cites·25 claims
- 0987US10493559B2Method and apparatus for laser machiningSTRAW MARCUS·Filed 2009·Granted Dec 3, 2019·10 cites·20 claims
- 1086US8629416B2Charged particle beam masking for laser ablation micromachiningSTRAW MARCUS·Filed 2012·Granted Jan 14, 2014·5 cites·24 claims
- 1182US8921811B2High pressure charged particle beam systemTOTH MILOS·Filed 2008·Granted Dec 30, 2014·7 cites·18 claims
- 1281US8598542B2Charged particle beam processingTOTH MILOS·Filed 2010·Granted Dec 3, 2013·5 cites·8 claims
- 1379US10538844B2Nanofabrication using a new class of electron beam induced surface processing techniquesFEI CO·Filed 2015·Granted Jan 21, 2020·3 cites·15 claims
- 1478US2024418660A1Particle-induced x-ray emission (pixe) using hydrogen and multi-species focused ion beamsFEI CO·Filed 2024·Application pending·0 cites
- 1576US9123506B2Electron beam-induced etchingFEI CO·Filed 2013·Granted Sep 1, 2015·3 cites·19 claims
- 1676US7791020B2Multistage gas cascade amplifierFEI CO·Filed 2008·Granted Sep 7, 2010·4 cites·36 claims
- 1774US11377740B2Nanofabrication using a new class of electron beam induced surface processing techniquesFEI CO·Filed 2019·Granted Jul 5, 2022·0 cites·10 claims
- 1872US8299432B2Scanning transmission electron microscope using gas amplificationTOTH MILOS·Filed 2008·Granted Oct 30, 2012·4 cites·22 claims
- 1971US9951417B2Method of depositing materialFEI CO·Filed 2014·Granted Apr 24, 2018·0 cites·21 claims
- 2071US8853592B2Method for laser machining a sample having a crystalline structureSTRAW MARCUS·Filed 2009·Granted Oct 7, 2014·2 cites·26 claims
- 2169US8303833B2High resolution plasma etchTOTH MILOS·Filed 2007·Granted Nov 6, 2012·3 cites·22 claims
- 2263US9812286B2Localized, in-vacuum modification of small structuresFEI CO·Filed 2015·Granted Nov 7, 2017·0 cites·17 claims
- 2360US9799490B2Charged particle beam processing using process gas and cooled surfaceFEI CO·Filed 2015·Granted Oct 24, 2017·1 cites·23 claims
- 2459US9679741B2Environmental cell for charged particle beam systemNOVAK LIBOR·Filed 2010·Granted Jun 13, 2017·2 cites·40 claims
- 2556US2014054267A1Gas-assisted laser ablationFEI CO·Filed 2013·Application pending·0 cites
- 2651US9255339B2Localized, in-vacuum modification of small structuresBOTMAN AURELIEN PHILIPPE JEAN MACLOU·Filed 2011·Granted Feb 9, 2016·0 cites·16 claims
- 2750US2013192758A1High Resolution Plasma EtchFEI CO·Filed 2012·Application pending·0 cites
- 2849US10304658B2Electron beam-induced etchingFEI CO·Filed 2015·Granted May 28, 2019·0 cites·9 claims
- 2948US10777383B2Method for alignment of a light beam to a charged particle beamFEI CO·Filed 2018·Granted Sep 15, 2020·0 cites·20 claims
- 3046US10501851B2Attachment of nano-objects to beam-deposited structuresFEI CO·Filed 2016·Granted Dec 10, 2019·0 cites·20 claims
- 3143US9633816B2Electron beam microscope with improved imaging gas and method of useFEI CO·Filed 2015·Granted Apr 25, 2017·0 cites·17 claims
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