Inventor · disambiguated record
Susumu Hiyama
Also filed as: HIYAMA SUSUMU
47 granted patents·2 pending applications·195 citations·filing 1991–2023
98Inventor score
Top patents by PatentIndex Score
49 records- 0197US11862652B2Image pickup element, method of manufacturing image pickup element, and electronic apparatusSONY GROUP CORP·Filed 2022·Granted Jan 2, 2024·2 cites·20 claims
- 0297US8034649B2Solid state imaging device, method of manufacturing the same, and imaging apparatusSONY CORP·Filed 2010·Granted Oct 11, 2011·13 cites·3 claims
- 0396US10950644B2Image pickup element, method of manufacturing image pickup element, and electronic apparatusSONY CORP·Filed 2019·Granted Mar 16, 2021·4 cites·20 claims
- 0496US8183603B2Solid-state imaging device for inhibiting dark currentYAMAGUCHI TETSUJI·Filed 2007·Granted May 22, 2012·24 cites·28 claims
- 0595US9502454B2Image pickup element, method of manufacturing image pickup element, and electronic apparatusSONY CORP·Filed 2016·Granted Nov 22, 2016·5 cites·30 claims
- 0695US8981517B2Solid-state image pickup device and image pickup apparatus including the sameSONY CORP·Filed 2013·Granted Mar 17, 2015·12 cites·15 claims
- 0795US8445985B2Solid-state imaging device, method of manufacturing the same, and electronic equipmentHIYAMA SUSUMU·Filed 2011·Granted May 21, 2013·26 cites·37 claims
- 0894US11557623B2Image pickup element, method of manufacturing image pickup element, and electronic apparatusSONY CORP·Filed 2021·Granted Jan 17, 2023·2 cites·22 claims
- 0994US9337226B2Image pickup element, method of manufacturing image pickup element, and electronic apparatusSONY CORP·Filed 2014·Granted May 10, 2016·7 cites·16 claims
- 1094US8704324B2Solid-state imaging device, method of manufacturing the same, and electronic equipmentSONY CORP·Filed 2013·Granted Apr 22, 2014·10 cites·31 claims
- 1193US10461110B2Image pickup element, method of manufacturing image pickup element, and electronic apparatusSONY CORP·Filed 2018·Granted Oct 29, 2019·6 cites·20 claims
- 1293US8471314B2Solid-state imaging device, method for producing same, and cameraMARUYAMA YASUSHI·Filed 2010·Granted Jun 25, 2013·9 cites·10 claims
- 1390US9893105B2Image pickup element, method of manufacturing image pickup element, and electronic apparatusSONY CORP·Filed 2016·Granted Feb 13, 2018·4 cites·28 claims
- 1489US8405016B2Solid-state image pickup element, method of manufacturing the same, and image pickup apparatus including the sameOSHIYAMA ITARU·Filed 2010·Granted Mar 26, 2013·5 cites·9 claims
- 1587US12166058B2Image pickup element, method of manufacturing image pickup element, and electronic apparatusSONY GROUP CORP·Filed 2023·Granted Dec 10, 2024·0 cites·20 claims
- 1687US9000493B2Solid-state imaging device, method for producing same, and cameraYAMAGUCHI TETSUJI·Filed 2012·Granted Apr 7, 2015·3 cites·30 claims
- 1787US8492804B2Solid-state imaging device, method for producing same, and cameraYAMAGUCHI TETSUJI·Filed 2010·Granted Jul 23, 2013·3 cites·7 claims
- 1887US8486748B2Method for manufacturing solid-state imaging deviceIKEDA HARUMI·Filed 2011·Granted Jul 16, 2013·2 cites·20 claims
- 1987US8334552B2Solid state imaging device that suppresses generation of dark current, and imaging apparatusOSHIYAMA ITARU·Filed 2010·Granted Dec 18, 2012·2 cites·7 claims
- 2087US8288836B2Solid state imaging device capable of supressing generation of dark currentOSHIYAMA ITARU·Filed 2008·Granted Oct 16, 2012·5 cites·18 claims
- 2185US9368536B2Solid state imaging device for reducing dark current, method of manufacturing the same, and imaging apparatusSONY CORP·Filed 2014·Granted Jun 14, 2016·1 cites·20 claims
- 2285US8293563B2Method for manufacturing semiconductor deviceHIYAMA SUSUMU·Filed 2010·Granted Oct 23, 2012·4 cites·21 claims
- 2385US8217479B2Solid-state image pickup element, method of manufacturing the same, and image pickup apparatus including the sameOSHIYAMA ITARU·Filed 2010·Granted Jul 10, 2012·3 cites·19 claims
- 2483US8946840B2Solid state imaging device, with suppressed dark current, method of manufacturing, and imaging apparatusOSHIYAMA ITARU·Filed 2010·Granted Feb 3, 2015·1 cites·18 claims
- 2583US8928103B2Solid-state imaging element, method of manufacturing the same, solid-state imaging apparatus, and imaging apparatusSONY CORP·Filed 2013·Granted Jan 6, 2015·3 cites·20 claims
- 2683US7863076B2Solid-state image pickup device, method for making same, and image pickup apparatusSONY CORP·Filed 2008·Granted Jan 4, 2011·6 cites·11 claims
- 2782US7968365B2Method for manufacturing solid-state imaging deviceSONY CORP·Filed 2009·Granted Jun 28, 2011·6 cites·13 claims
- 2880US8097928B2Solid-state imaging device, and imaging apparatusIKEDA HARUMI·Filed 2008·Granted Jan 17, 2012·2 cites·6 claims
- 2979US9735192B2Solid state imaging device for reducing dark current and imaging apparatusSONY CORP·Filed 2016·Granted Aug 15, 2017·1 cites·10 claims
- 3077US10770500B2Solid state imaging device for reducing dark currentSONY CORP·Filed 2018·Granted Sep 8, 2020·0 cites·16 claims
- 3177US8471348B2Solid-state imaging element, method of manufacturing the same, solid-state imaging apparatus, and imaging apparatusOHBA YOSHIYUKI·Filed 2011·Granted Jun 25, 2013·3 cites·19 claims
- 3276US11676978B2Solid-state imaging device, method of manufacturing the same, and electronic equipmentSONY GROUP CORP·Filed 2022·Granted Jun 13, 2023·0 cites·11 claims
- 3371US11251212B2Solid-state imaging device, method of manufacturing the same, and electronic equipmentSONY CORP·Filed 2019·Granted Feb 15, 2022·0 cites·18 claims
- 3468US8709958B2Solid-state image pickup element, method of manufacturing the same, and image pickup apparatus including the sameOSHIYAMA ITARU·Filed 2012·Granted Apr 29, 2014·0 cites·8 claims
- 3567US8471347B2Solid-state imaging device capable of suppressing generation of dark current and imaging apparatusOSHIYAMA ITARU·Filed 2010·Granted Jun 25, 2013·0 cites·13 claims
- 3666US10529760B2Solid-state imaging device, method of manufacturing the same, and electronic equipmentSONY CORP·Filed 2017·Granted Jan 7, 2020·0 cites·20 claims
- 3766US10192921B2Solid state imaging device for reducing dark current, method of manufacturing the same, and imaging apparatusSONY CORP·Filed 2017·Granted Jan 29, 2019·0 cites·10 claims
- 3865US9793307B2Solid-state imaging device, method of manufacturing the same, and electronic equipmentSONY CORP·Filed 2017·Granted Oct 17, 2017·0 cites·30 claims
- 3965US9666632B2Solid-state imaging device, method of manufacturing the same, and electronic equipmentSONY CORP·Filed 2014·Granted May 30, 2017·0 cites·28 claims
- 4064US9721985B2Solid-state imaging device, method of manufacturing the same, and electronic equipmentSONY CORP·Filed 2017·Granted Aug 1, 2017·0 cites·29 claims
- 4162US9601539B2Solid-state imaging device, method of manufacturing the same, and electronic equipmentSONY CORP·Filed 2016·Granted Mar 21, 2017·0 cites·27 claims
- 4262US2010060758A1Solid-state imaging device and method of producing solid-state imaging deviceSONY CORP·Filed 2009·Application pending·0 cites
- 4359US5168095AMethod for synthesizing a composite oxide by citrating processNISSAN MOTOR·Filed 1991·Granted Dec 1, 1992·12 cites·27 claims
- 4455US10361242B2Solid-state imaging device and method of producing solid-state imaging deviceSONY CORP·Filed 2017·Granted Jul 23, 2019·0 cites·18 claims
- 4548US8574941B2Method for manufacturing solid-state imaging deviceHIYAMA SUSUMU·Filed 2011·Granted Nov 5, 2013·0 cites·8 claims
- 4648US6841850B2Semiconductor device having silicon nitride film and silicon oxide film, and method of fabricating the sameTOSHIBA KK·Filed 2002·Granted Jan 11, 2005·1 cites·9 claims
- 4745US6992020B2Method of fabricating semiconductor deviceTOSHIBA KK·Filed 2004·Granted Jan 31, 2006·0 cites·12 claims
- 4845US2008182171A1Composition for negative electrode of non-aqueous rechargeable battery and non-aqueous rechargeable battery prepared by using sameMAEDA HIDEAKI·Filed 2007·Application pending·0 cites
- 4942US5449660AMethod of producing compound oxide by using partly citrating processNISSAN MOTOR·Filed 1993·Granted Sep 12, 1995·8 cites·13 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →