Inventor · disambiguated record
Hisato Takehara
Also filed as: TAKEHARA HISATO
12 granted patents·5 pending applications·52 citations·filing 2008–2025
89Inventor score
Top patents by PatentIndex Score
17 records- 0182US8535607B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Sep 17, 2013·9 cites·9 claims
- 0277US8329103B2Sample analyzer and method for analyzing samplesWAKAMIYA YUJI·Filed 2008·Granted Dec 11, 2012·10 cites·11 claims
- 0375US8231830B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Jul 31, 2012·8 cites·12 claims
- 0475US8040757B2Sample analyzing apparatusSYSMEX CORP·Filed 2008·Granted Oct 18, 2011·4 cites·17 claims
- 0571US2025110140A1Sample analyzer and sample analysis methodSYSMEX CORP·Filed 2024·Application pending·0 cites
- 0670US8778268B2Specimen analyzer, abnormality control method of the same and computer program productTAKEHARA HISATO·Filed 2008·Granted Jul 15, 2014·8 cites·5 claims
- 0770US8071029B2Sample analyzer and sample analyzing methodWAKAMIYA YUJI·Filed 2008·Granted Dec 6, 2011·3 cites·12 claims
- 0870US7707010B2Sample analyzer and error information displaying methodSYSMEX CORP·Filed 2008·Granted Apr 27, 2010·4 cites·13 claims
- 0967US8425839B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Apr 23, 2013·2 cites·19 claims
- 1067US8335662B2Sample analyzer and error information displaying methodWAKAMIYA YUJI·Filed 2010·Granted Dec 18, 2012·2 cites·6 claims
- 1167US7957935B2Analyzer and method of restarting sample measurementSYSMEX CORP·Filed 2008·Granted Jun 7, 2011·2 cites·20 claims
- 1265US2025110141A1Sample analyzer and method for determining dirt on placement part included in sample analyzerSYSMEX CORP·Filed 2024·Application pending·0 cites
- 1355US2025251408A1Sample analysis system and sample analysis methodSYSMEX CORP·Filed 2025·Application pending·0 cites
- 1454US8279715B2Sample analyzing apparatusWAKAMIYA YUJI·Filed 2011·Granted Oct 2, 2012·0 cites·17 claims
- 1549US2009220379A1Analyzer and measurement restarting methodSYSMEX CORP·Filed 2008·Application pending·0 cites
- 1642US8366998B2Sample analyzer and sample analyzing methodSYSMEX CORP·Filed 2008·Granted Feb 5, 2013·0 cites·13 claims
- 1739US2011077871A1Analysis apparatus, information processing unit, and an information displaying methodFUKUMA DAIGO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →