Inventor · disambiguated record
Tomohiro Okuzaki
Also filed as: OKUZAKI TOMOHIRO
13 granted patents·1 pending application·44 citations·filing 2008–2020
88Inventor score
Top patents by PatentIndex Score
14 records- 0182US8535607B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Sep 17, 2013·9 cites·9 claims
- 0277US8329103B2Sample analyzer and method for analyzing samplesWAKAMIYA YUJI·Filed 2008·Granted Dec 11, 2012·10 cites·11 claims
- 0375US8231830B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Jul 31, 2012·8 cites·12 claims
- 0475US8040757B2Sample analyzing apparatusSYSMEX CORP·Filed 2008·Granted Oct 18, 2011·4 cites·17 claims
- 0572US8871147B2Sample analyzer and storage mediumWAKAMIYA YUJI·Filed 2012·Granted Oct 28, 2014·2 cites·12 claims
- 0670US8071029B2Sample analyzer and sample analyzing methodWAKAMIYA YUJI·Filed 2008·Granted Dec 6, 2011·3 cites·12 claims
- 0770US7707010B2Sample analyzer and error information displaying methodSYSMEX CORP·Filed 2008·Granted Apr 27, 2010·4 cites·13 claims
- 0868US11268954B2Immunoassay apparatusSYSMEX CORP·Filed 2020·Granted Mar 8, 2022·0 cites·9 claims
- 0967US8425839B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Apr 23, 2013·2 cites·19 claims
- 1067US8335662B2Sample analyzer and error information displaying methodWAKAMIYA YUJI·Filed 2010·Granted Dec 18, 2012·2 cites·6 claims
- 1160US10648973B2Immunoassay apparatusSYSMEX CORP·Filed 2017·Granted May 12, 2020·0 cites·11 claims
- 1254US8279715B2Sample analyzing apparatusWAKAMIYA YUJI·Filed 2011·Granted Oct 2, 2012·0 cites·17 claims
- 1347US2014295562A1Sample analyzer and method for loading reagent containerSYSMEX CORP·Filed 2013·Application pending·0 cites
- 1442US8366998B2Sample analyzer and sample analyzing methodSYSMEX CORP·Filed 2008·Granted Feb 5, 2013·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →