Inventor · disambiguated record
Yoshio Komoto
Also filed as: KOMOTO YOSHIO
10 granted patents·58 citations·filing 1996–2011
85Inventor score
Top patents by PatentIndex Score
10 records- 0190US8289040B2Test wafer unit and test systemKOMOTO YOSHIO·Filed 2010·Granted Oct 16, 2012·11 cites·22 claims
- 0288US8253428B2Probe apparatus and test apparatusKOMOTO YOSHIO·Filed 2010·Granted Aug 28, 2012·10 cites·20 claims
- 0375US8410807B2Test system and probe apparatusUMEMURA YOSHIHARU·Filed 2010·Granted Apr 2, 2013·4 cites·12 claims
- 0470US8134379B2Probe wafer, probe device, and testing systemKOMOTO YOSHIO·Filed 2010·Granted Mar 13, 2012·3 cites·10 claims
- 0563US5740086ASemiconductor test system linked to cad dataADVANTEST CORP·Filed 1996·Granted Apr 14, 1998·28 cites·5 claims
- 0658US8427187B2Probe wafer, probe device, and testing systemKOMOTO YOSHIO·Filed 2010·Granted Apr 23, 2013·1 cites·18 claims
- 0745US8667669B2Apparatus and method for manufacturing a packaged deviceKOMOTO YOSHIO·Filed 2011·Granted Mar 11, 2014·0 cites·20 claims
- 0845US8652857B2Test apparatus, test method and manufacturing method for testing a device under test packaged in a test packageKOMOTO YOSHIO·Filed 2011·Granted Feb 18, 2014·0 cites·22 claims
- 0945US8624620B2Test system and write waferTOKUNAGA YASUO·Filed 2010·Granted Jan 7, 2014·1 cites·10 claims
- 1037US8749260B2Test wafer unit and test systemTOKUNAGA YASUO·Filed 2010·Granted Jun 10, 2014·0 cites·20 claims
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