Assignee
KOMOTO YOSHIO
JP·6 granted patents·25 citations·filing 2010–2011
Top patents by PatentIndex Score
6 records- 0190US8289040B2Test wafer unit and test systemKOMOTO YOSHIO·Filed 2010·Granted Oct 16, 2012·11 cites·22 claims
- 0288US8253428B2Probe apparatus and test apparatusKOMOTO YOSHIO·Filed 2010·Granted Aug 28, 2012·10 cites·20 claims
- 0370US8134379B2Probe wafer, probe device, and testing systemKOMOTO YOSHIO·Filed 2010·Granted Mar 13, 2012·3 cites·10 claims
- 0458US8427187B2Probe wafer, probe device, and testing systemKOMOTO YOSHIO·Filed 2010·Granted Apr 23, 2013·1 cites·18 claims
- 0545US8667669B2Apparatus and method for manufacturing a packaged deviceKOMOTO YOSHIO·Filed 2011·Granted Mar 11, 2014·0 cites·20 claims
- 0645US8652857B2Test apparatus, test method and manufacturing method for testing a device under test packaged in a test packageKOMOTO YOSHIO·Filed 2011·Granted Feb 18, 2014·0 cites·22 claims
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