Inventor · disambiguated record
Hideki Kawakatsu
Also filed as: KAWAKATSU HIDEKI
16 granted patents·8 pending applications·121 citations·filing 2000–2009
93Inventor score
Files withJAPAN SCIENCE & TECH AGENCY16FOUND PROMOTION IND SCIENCE2KAWAKATSU HIDEKI2PANASONIC CORP2JAPAN SCIENCE & TECH CORP1
Top patents by PatentIndex Score
24 records- 0191US7411189B2Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantileversFOUND PROMOTION IND SCIENCE·Filed 2006·Granted Aug 12, 2008·16 cites·8 claims
- 0288US7309863B2Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantileversJAPAN SCIENCE & TECH AGENCY·Filed 2006·Granted Dec 18, 2007·8 cites·3 claims
- 0383US7358648B2Torsion resonator and filter using thisMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Granted Apr 15, 2008·13 cites·15 claims
- 0481US7545508B2Interferometric apparatus utilizing a cantilever array to measure a surfaceFOUND PROMOTION IND SCIENCE·Filed 2006·Granted Jun 9, 2009·8 cites·7 claims
- 0581US6611178B1Nanometer-order mechanical vibrator, production method thereof and measuring device using itJAPAN SCIENCE & TECH CORP·Filed 2000·Granted Aug 26, 2003·23 cites·35 claims
- 0679US7741932B2Torsional resonator and filter using thisPANASONIC CORP·Filed 2005·Granted Jun 22, 2010·10 cites·8 claims
- 0779US7220962B2Cantilever array and scanning probe microscope including a sliding, guiding, and rotating mechanismJAPAN SCIENCE & TECH AGENCY·Filed 2002·Granted May 22, 2007·20 cites·3 claims
- 0864US7719663B2Heterodyne laser doppler probe and measurement system using the sameJAPAN SCIENCE & TECH AGENCY·Filed 2006·Granted May 18, 2010·4 cites·9 claims
- 0958US8151368B2Dynamic mode AFM apparatusKAWAKATSU HIDEKI·Filed 2009·Granted Apr 3, 2012·3 cites·16 claims
- 1058US7694347B2Measuring device with daisy type cantilever wheelJAPAN SCIENCE & TECH AGENCY·Filed 2005·Granted Apr 6, 2010·2 cites·39 claims
- 1158US7622847B2Method and device for precisely resisting and moving high loadJAPAN SCIENCE & TECH AGENCY·Filed 2005·Granted Nov 24, 2009·2 cites·10 claims
- 1255US7880364B2Parametric resonator and filter using the samePANASONIC CORP·Filed 2007·Granted Feb 1, 2011·2 cites·22 claims
- 1355US7297568B2Three-dimensional structural body composed of silicon fine wire, its manufacturing method, and device using sameJAPAN SCIENCE & TECH AGENCY·Filed 2003·Granted Nov 20, 2007·7 cites·12 claims
- 1449US7847953B2Homodyne laser interferometer probe and displacement measurement system using the sameJAPAN SCIENCE & TECH AGENCY·Filed 2006·Granted Dec 7, 2010·1 cites·8 claims
- 1549US7834519B2Method and device for precisely resisting and moving high loadJAPAN SCIENCE & TECH AGENCY·Filed 2009·Granted Nov 16, 2010·0 cites·7 claims
- 1645US7904966B2Scanning probe microscope apparatusJAPAN SCIENCE & TECH AGENCY·Filed 2007·Granted Mar 8, 2011·2 cites·6 claims
- 1744US2006273445A1Three-dimensional structure composed of silicon fine wires, method for producing the same, and device including the sameJAPAN SCIENCE & TECH AGENCY·Filed 2006·Application pending·0 cites
- 1841US2007158554A1Probe for probe microscope using transparent substrate, method of producing the same, and probe microscope deviceJAPAN SCIENCE & TECH AGENCY·Filed 2004·Application pending·0 cites
- 1937US2007108159A1Probe for scanning probe microscope and method of producing the sameJAPAN SCIENCE & TECH AGENCY·Filed 2004·Application pending·0 cites
- 2037US2009320167A1Mechanical vibrator and production method thereforJAPAN SCIENCE & TECH AGENCY·Filed 2005·Application pending·0 cites
- 2137US2007197176A1Fm signal demodulation method and device thereofJAPAN SCIENCE & TECH AGENCY·Filed 2004·Application pending·0 cites
- 2236US2007140905A1Nanogap series substance capturing, detecting and identifying method and deviceJAPAN SCIENCE & TECH AGENCY·Filed 2005·Application pending·0 cites
- 2333US2008252385A1Highly Sensitive Force/Mass Detection Method and Device Using Phase Synchronization CircuitJAPAN SCIENCE & TECH AGENCY·Filed 2005·Application pending·0 cites
- 2431US2006162455A1Method and device for measuring vibration frequency of multi-cantileverKAWAKATSU HIDEKI·Filed 2003·Application pending·0 cites
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