Inventor · disambiguated record
Ernest P. Walker
Also filed as: WALKER ERNEST · WALKER ERNEST P
17 granted patents·237 citations·filing 1987–2007
94Inventor score
Files withTERADYNE INC16
Top patents by PatentIndex Score
17 records- 0183US7023366B1Using a parametric measurement unit for converter testingTERADYNE INC·Filed 2005·Granted Apr 4, 2006·15 cites·8 claims
- 0276US7574632B2Strobe technique for time stamping a digital signalTERADYNE INC·Filed 2005·Granted Aug 11, 2009·8 cites·7 claims
- 0376US7256600B2Method and system for testing semiconductor devicesTERADYNE INC·Filed 2004·Granted Aug 14, 2007·20 cites·19 claims
- 0476US6448575B1Temperature control structureTERADYNE INC·Filed 2000·Granted Sep 10, 2002·23 cites·19 claims
- 0575US7508228B2Method and system for monitoring test signals for semiconductor devicesTERADYNE INC·Filed 2005·Granted Mar 24, 2009·8 cites·18 claims
- 0674US7573957B2Strobe technique for recovering a clock in a digital signalTERADYNE INC·Filed 2005·Granted Aug 11, 2009·7 cites·20 claims
- 0774US4816750AAutomatic circuit tester control systemTERADYNE INC·Filed 1987·Granted Mar 28, 1989·37 cites·8 claims
- 0870US7856578B2Strobe technique for test of digital signal timingTERADYNE INC·Filed 2005·Granted Dec 21, 2010·6 cites·5 claims
- 0967US7102375B2Pin electronics with high voltage functionalityTERADYNE INC·Filed 2004·Granted Sep 5, 2006·11 cites·13 claims
- 1063US6049901ATest system for integrated circuits using a single memory for both the parallel and scan modes of testingFiled 1997·Granted Apr 11, 2000·33 cites·19 claims
- 1160US7403030B2Using parametric measurement units as a source of power for a device under testTERADYNE INC·Filed 2004·Granted Jul 22, 2008·9 cites·19 claims
- 1255US7991046B2Calibrating jitterTERADYNE INC·Filed 2007·Granted Aug 2, 2011·1 cites·17 claims
- 1354US5657486AAutomatic test equipment with pipelined sequencerTERADYNE INC·Filed 1995·Granted Aug 12, 1997·23 cites·24 claims
- 1453US7135881B2Method and system for producing signals to test semiconductor devicesTERADYNE INC·Filed 2004·Granted Nov 14, 2006·4 cites·19 claims
- 1553US6374379B1Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipmentTERADYNE INC·Filed 1999·Granted Apr 16, 2002·17 cites·19 claims
- 1650US7271610B2Using a parametric measurement unit to sense a voltage at a device under testTERADYNE INC·Filed 2004·Granted Sep 18, 2007·4 cites·11 claims
- 1744US6282682B1Automatic test equipment using sigma delta modulation to create reference levelsTERADYNE INC·Filed 1999·Granted Aug 28, 2001·11 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →