Inventor · disambiguated record
Patrick Mcnally
Also filed as: MCNALLY PATRICK · MCNALLY PATRICK J
5 granted patents·5 pending applications·9 citations·filing 2004–2022
70Inventor score
Files withUNIV DUBLIN CITY6HAYDEN CHANEL MOIRA PIA1MCNALLY PATRICK1SONEX METROLOGY LTD1UNIV NORTHWESTERN1
Top patents by PatentIndex Score
10 records- 0184US12322580B2Electromagnetic field signal acquisition system for high signal-to-noise ratios, and electrical noise immunityUNIV DUBLIN CITY·Filed 2021·Granted Jun 3, 2025·2 cites·10 claims
- 0273US12278095B2System and method for remote sensing a plasmaUNIV DUBLIN CITY·Filed 2022·Granted Apr 15, 2025·0 cites·13 claims
- 0372US11476098B2System and method for remote sensing a plasmaUNIV DUBLIN CITY·Filed 2018·Granted Oct 18, 2022·1 cites·13 claims
- 0461US7586611B2Method and apparatus for analysis of semiconductor materials using photoacoustic spectroscopy techniquesUNIV DUBLIN CITY·Filed 2004·Granted Sep 8, 2009·6 cites·60 claims
- 0547US2023335382A1Non-invasive measurement of plasma systemsUNIV DUBLIN CITY·Filed 2021·Application pending·0 cites
- 0643US2015204822A1Photoacoustic metrology toolSONEX METROLOGY LTD·Filed 2013·Application pending·0 cites
- 0739US2011056272A1system for analysing plasmaUNIV DUBLIN CITY·Filed 2009·Application pending·0 cites
- 0835US2011204483A1Electroluminescent device for the production of ultra-violet lightMCNALLY PATRICK·Filed 2005·Application pending·0 cites
- 0935US2015356090A1System and Method for Dynamically Constructing Theatrical Experiences from Digital ContentUNIV NORTHWESTERN·Filed 2015·Application pending·0 cites
- 1030US10031109B2Optoacoustic inspection device for inspection of semiconductor wafersHAYDEN CHANEL MOIRA PIA·Filed 2011·Granted Jul 24, 2018·0 cites·34 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →