Inventor · disambiguated record
Yuichi Harada
Also filed as: HARADA YUICHI
64 granted patents·6 pending applications·327 citations·filing 1975–2025
98Inventor score
Files withFUJI ELECTRIC CO LTD52BROTHER IND LTD5DAICEL LTD4FUJI ELEC DEVICE TECH CO LTD2FUJITSU LTD2
Top patents by PatentIndex Score
70 records- 0195US11342186B2Semiconductor device and manufacturing method thereofFUJI ELECTRIC CO LTD·Filed 2020·Granted May 24, 2022·3 cites·26 claims
- 0289US11158631B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2019·Granted Oct 26, 2021·3 cites·22 claims
- 0386US2025318255A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2025·Application pending·0 cites
- 0485US6054728AInsulated gate thyristorFUJI ELECTRIC CO LTD·Filed 1998·Granted Apr 25, 2000·56 cites·8 claims
- 0584US2025132160A1Semiconductor device and manufacturing method thereofFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 0683US12191148B2Semiconductor device and manufacturing method thereofFUJI ELECTRIC CO LTD·Filed 2023·Granted Jan 7, 2025·0 cites·29 claims
- 0783US12087849B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2021·Granted Sep 10, 2024·1 cites·20 claims
- 0883US9960235B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted May 1, 2018·4 cites·7 claims
- 0981US12342608B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2023·Granted Jun 24, 2025·0 cites·19 claims
- 1081US10079298B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Sep 18, 2018·4 cites·12 claims
- 1181US9997603B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2017·Granted Jun 12, 2018·3 cites·8 claims
- 1280US12342556B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2024·Granted Jun 24, 2025·0 cites·20 claims
- 1380US10090379B2Hydrogen occlusion semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2017·Granted Oct 2, 2018·3 cites·11 claims
- 1480US5914503AInsulated gate thyristorFUJI ELECTRIC CO LTD·Filed 1997·Granted Jun 22, 1999·48 cites·40 claims
- 1578US11735424B2Semiconductor device and manufacturing method thereofFUJI ELECTRIC CO LTD·Filed 2022·Granted Aug 22, 2023·0 cites·33 claims
- 1676US7637565B2Vehicle seat with monitorTOYOTA BOSHOKU KK·Filed 2007·Granted Dec 29, 2009·11 cites·9 claims
- 1775US11631665B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2021·Granted Apr 18, 2023·0 cites·20 claims
- 1875US10096703B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Oct 9, 2018·2 cites·9 claims
- 1972US11949005B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2022·Granted Apr 2, 2024·0 cites·20 claims
- 2072US2024429311A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 2171US9627486B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2013·Granted Apr 18, 2017·3 cites·11 claims
- 2269US9184230B2Silicon carbide vertical field effect transistorHARADA YUICHI·Filed 2012·Granted Nov 10, 2015·3 cites·7 claims
- 2369US9142463B2Semiconductor deviceHARADA YUICHI·Filed 2011·Granted Sep 22, 2015·3 cites·12 claims
- 2466US9722018B2Vertical high voltage semiconductor apparatus and fabrication method of vertical high voltage semiconductor apparatusFUJI ELECTRIC CO LTD·Filed 2013·Granted Aug 1, 2017·1 cites·9 claims
- 2566US4121006ACoated polyolefin filmDAICEL LTD·Filed 1976·Granted Oct 17, 1978·16 cites·9 claims
- 2665US5981984AInsulated gate thyristorFUJI ELECTRIC CO LTD·Filed 1997·Granted Nov 9, 1999·25 cites·24 claims
- 2765US2025151365A1Semiconductor device and fabrication method of semiconductor device having improved breaking withstand capabilityFUJI ELECTRIC CO LTD·Filed 2025·Application pending·0 cites
- 2864US11380784B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2020·Granted Jul 5, 2022·0 cites·21 claims
- 2964US5874751AInsulated gate thyristorFUJI ELECTRIC CO LTD·Filed 1996·Granted Feb 23, 1999·25 cites·27 claims
- 3063US11456359B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Sep 27, 2022·1 cites·9 claims
- 3162US12199162B2Semiconductor device and fabrication method of semiconductor device having improved breaking withstand capabilityFUJI ELECTRIC CO LTD·Filed 2022·Granted Jan 14, 2025·0 cites·15 claims
- 3262US6278140B1Insulated gate thyristorFUJI ELECTRIC CO LTD·Filed 2000·Granted Aug 21, 2001·9 cites·3 claims
- 3362US4148775AHot-melt adhesive compositionsDAICEL LTD·Filed 1978·Granted Apr 10, 1979·13 cites·9 claims
- 3461US7982524B2Level shift circuit and semiconductor device thereofFUJI ELECTRIC CO LTD·Filed 2008·Granted Jul 19, 2011·2 cites·15 claims
- 3561US7723817B2Semiconductor device and manufacturing method thereofFUJI ELEC DEVICE TECH CO LTD·Filed 2006·Granted May 25, 2010·1 cites·6 claims
- 3660US9537002B2Semiconductor device with SiC base layerFUJI ELECTRIC CO LTD·Filed 2013·Granted Jan 3, 2017·1 cites·9 claims
- 3757US10692979B2Method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2019·Granted Jun 23, 2020·0 cites·2 claims
- 3853US6242967B1Low on resistance high speed off switching device having unipolar transistorsFUJI ELECTRIC CO LTD·Filed 1999·Granted Jun 5, 2001·14 cites·27 claims
- 3953US6091087AInsulated gate thyristorFUJI ELECTRIC CO LTD·Filed 1997·Granted Jul 18, 2000·15 cites·46 claims
- 4053US2023038712A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2022·Application pending·0 cites
- 4153US2023144542A1Manufacturing method of semiconductor device and semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2022·Application pending·0 cites
- 4251US10211330B2Vertical high voltage semiconductor apparatus and fabrication method of vertical high voltage semiconductor apparatusFUJI ELECTRIC CO LTD·Filed 2017·Granted Feb 19, 2019·0 cites·1 claims
- 4351US8418261B2Stage for scanning probe microscopy and sample observation methodKASAI NAHOKO·Filed 2008·Granted Apr 9, 2013·2 cites·10 claims
- 4450US10396161B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Aug 27, 2019·0 cites·3 claims
- 4548US7405913B2Semiconductor device having transistor with high electro-static discharge capability and high noise capabilityFUJI ELEC DEVICE TECH CO LTD·Filed 2004·Granted Jul 29, 2008·6 cites·12 claims
- 4648USD391293SInk cartridgePITNEY BOWES INC·Filed 1996·Granted Feb 24, 1998·6 cites·1 claims
- 4743US11107910B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2020·Granted Aug 31, 2021·0 cites·15 claims
- 4843US9450051B2High voltage semiconductor apparatusFUJI ELECTRIC CO LTD·Filed 2013·Granted Sep 20, 2016·0 cites·12 claims
- 4943US3997625AHot melt adhesive for metalsDAICEL LTD·Filed 1975·Granted Dec 14, 1976·8 cites·2 claims
- 5042US10319820B2Semiconductor device having silicon carbide layer provided on silicon carbide substrateFUJI ELECTRIC CO LTD·Filed 2017·Granted Jun 11, 2019·0 cites·13 claims
Showing the top 50 of 70 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →