Inventor · disambiguated record
Gerrit Jacobus Hendrik Brussaard
Also filed as: BRUSSAARD GERRIT JACOBUS HENDRIK
11 granted patents·1 pending application·11 citations·filing 2015–2022
83Inventor score
Files withASML NETHERLANDS BV12
Top patents by PatentIndex Score
12 records- 0184US9853412B2Radiation sourceASML NETHERLANDS BV·Filed 2015·Granted Dec 26, 2017·4 cites·19 claims
- 0281US10642172B2Illumination source for an inspection apparatus, inspection apparatus and inspection methodASML NETHERLANDS BV·Filed 2019·Granted May 5, 2020·2 cites·20 claims
- 0380US12050392B2Waveguides and manufacturing methods thereofASML NETHERLANDS BV·Filed 2022·Granted Jul 30, 2024·1 cites·20 claims
- 0480US10530111B2Apparatus for delivering gas and illumination source for generating high harmonic radiationASML NETHERLANDS BV·Filed 2018·Granted Jan 7, 2020·1 cites·17 claims
- 0575US10362665B2Methods and apparatus for optical metrologyASML NETHERLANDS BV·Filed 2018·Granted Jul 23, 2019·2 cites·20 claims
- 0673US10670974B2Metrology apparatus for and a method of determining a characteristic of interest of a structure on a substrateASML NETHERLANDS BV·Filed 2018·Granted Jun 2, 2020·1 cites·16 claims
- 0763US10630037B2Apparatus for delivering gas and illumination source for generating high harmonic radiationASML NETHERLANDS BV·Filed 2019·Granted Apr 21, 2020·0 cites·20 claims
- 0857US10900829B2Radiation sensor apparatusASML NETHERLANDS BV·Filed 2019·Granted Jan 26, 2021·0 cites·21 claims
- 0955US11347155B2Illumination source for an inspection apparatus, inspection apparatus and inspection methodASML NETHERLANDS BV·Filed 2019·Granted May 31, 2022·0 cites·16 claims
- 1050US10468225B2Electron source for a free electron laserASML NETHERLANDS BV·Filed 2017·Granted Nov 5, 2019·0 cites·17 claims
- 1147US11223181B2High harmonic generation radiation sourceASML NETHERLANDS BV·Filed 2019·Granted Jan 11, 2022·0 cites·19 claims
- 1246US2022326152A1An improved high harmonic generation apparatusASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →