Inventor · disambiguated record
Hiroyoshi Kuge
Also filed as: KUGE HIROYOSHI
2 granted patents·46 citations·filing 1998–2004
64Inventor score
Top patents by PatentIndex Score
2 records- 0173US7263679B2Semiconductor integrated circuit device with boundary scan test and design automation apparatus, boundary scan test method and programNEC ELECTRONICS CORP·Filed 2004·Granted Aug 28, 2007·21 cites·7 claims
- 0245US6212492B1Apparatus and method for circuit simulation which accounts for parasitic elementsNEC CORP·Filed 1998·Granted Apr 3, 2001·25 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →