Inventor · disambiguated record
Jiun-Chung Lee
Also filed as: LEE JIUN-CHUNG
3 granted patents·129 citations·filing 1997–2000
73Inventor score
Files withTAIWAN SEMICONDUCTOR MFG3
Top patents by PatentIndex Score
3 records- 0186US5956609AMethod for reducing stress and improving step-coverage of tungsten interconnects and plugsTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Sep 21, 1999·106 cites·14 claims
- 0263US6179691B1Method for endpoint detection for copper CMPTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Jan 30, 2001·21 cites·14 claims
- 0345US6503124B1Method for endpoint detection for copper CMPTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Jan 7, 2003·2 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →