Inventor · disambiguated record
Mark R. Taylor
Also filed as: TAYLOR MARK · TAYLOR MARK R · TAYLOR MARK RONALD
18 granted patents·3 pending applications·123 citations·filing 1992–2016
93Inventor score
Top patents by PatentIndex Score
21 records- 0190US7240266B2Clock control circuit for test that facilitates an at speed structural testIBM·Filed 2005·Granted Jul 3, 2007·23 cites·37 claims
- 0276US7734968B2Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit)IBM·Filed 2007·Granted Jun 8, 2010·8 cites·15 claims
- 0376US7513977B2Coke drum automated drill stem guide and cover systemCURTISS WRIGHT FLOW CONTROL·Filed 2005·Granted Apr 7, 2009·3 cites·31 claims
- 0475US7308630B2Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit)IBM·Filed 2005·Granted Dec 11, 2007·8 cites·5 claims
- 0574US7721170B2Apparatus and method for selectively implementing launch off scan capability in at speed testingIBM·Filed 2007·Granted May 18, 2010·7 cites·14 claims
- 0668US7779375B2Design structure for shutting off data capture across asynchronous clock domains during at-speed testingIBM·Filed 2007·Granted Aug 17, 2010·5 cites·11 claims
- 0766US8538718B2Clock edge grouping for at-speed testGRISE GARY D·Filed 2010·Granted Sep 17, 2013·2 cites·20 claims
- 0866US7466156B2System of digitally testing an analog driver circuitIBM·Filed 2004·Granted Dec 16, 2008·11 cites·13 claims
- 0965US7685542B2Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testingIBM·Filed 2007·Granted Mar 23, 2010·4 cites·15 claims
- 1056US6804803B2Method for testing integrated logic circuitsIBM·Filed 2001·Granted Oct 12, 2004·5 cites·25 claims
- 1156US5248930AWheel wall electrostatic generatorTAYLOR MARK R·Filed 1992·Granted Sep 28, 1993·19 cites·1 claims
- 1254US8579541B2Pick hole guard for manhole coversTHOMPSON TINA·Filed 2011·Granted Nov 12, 2013·1 cites·15 claims
- 1349US6882159B1Associated grouping of embedded cores for manufacturing testIBM·Filed 2003·Granted Apr 19, 2005·6 cites·20 claims
- 1445US9909276B2Pick hole guard for manhole covers6672205 CANADA INCORPORATED·Filed 2016·Granted Mar 6, 2018·0 cites·15 claims
- 1545US7659740B2System and method of digitally testing an analog driver circuitIBM·Filed 2008·Granted Feb 9, 2010·0 cites·4 claims
- 1641US10436837B2Auto test grouping/clock sequencing for at-speed testGLOBALFOUNDRIES INC·Filed 2015·Granted Oct 8, 2019·0 cites·20 claims
- 1737US6016646AAdjustable, resilent twine guide finger for twine wrap mechanism of large round balerDEERE & CO·Filed 1998·Granted Jan 25, 2000·6 cites·28 claims
- 1837US2008005634A1Scan chain circuitry that enables scan testing at functional clock speedGRISE GARY D·Filed 2006·Application pending·0 cites
- 1937US2008222472A1Method for automatic test pattern generation for one test constraint at a timeGRISE GARY D·Filed 2007·Application pending·0 cites
- 2036US2006248417A1Clock control circuit for test that facilitates an at speed structural testIBM·Filed 2005·Application pending·0 cites
- 2130US5519975ADrainage roofing tileFiled 1994·Granted May 28, 1996·15 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →