Inventor · disambiguated record
Cam Luong Lu
Also filed as: LU CAM · LU CAM L · LU CAM LUONG
3 granted patents·1 pending application·42 citations·filing 2003–2011
71Inventor score
Top patents by PatentIndex Score
4 records- 0181US7490307B2Automatic generating of timing constraints for the validation/signoff of test structuresLSI CORP·Filed 2006·Granted Feb 10, 2009·23 cites·20 claims
- 0265US7058909B2Method of generating an efficient stuck-at fault and transition delay fault truncated scan test pattern for an integrated circuit designLSI LOGIC CORP·Filed 2003·Granted Jun 6, 2006·12 cites·16 claims
- 0349US7444560B2Test clocking schemeLSI CORP·Filed 2004·Granted Oct 28, 2008·7 cites·15 claims
- 0436US2013111285A1Scan test circuitry comprising scan cells with functional output multiplexingCHAKRAVARTY SREEJIT·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →