Inventor · disambiguated record
Santosh Bhattacharyya
Also filed as: BHATTACHARYYA SANTOSH · BHATTACHARYYA SANTOSH K
20 granted patents·1 pending application·415 citations·filing 2004–2021
95Inventor score
Top patents by PatentIndex Score
21 records- 0196US7756658B2Systems and methods for detecting defects on a wafer and generating inspection results for the waferKLA TENCOR CORP·Filed 2008·Granted Jul 13, 2010·62 cites·20 claims
- 0295US8126255B2Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functionsBHASKAR KRIS·Filed 2008·Granted Feb 28, 2012·174 cites·61 claims
- 0394US8204296B2Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a waferBHASKAR KRIS·Filed 2010·Granted Jun 19, 2012·15 cites·16 claims
- 0493US7796804B2Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a waferKLA TENCOR CORP·Filed 2008·Granted Sep 14, 2010·25 cites·28 claims
- 0591US10832396B2And noise based care areasKLA TENCOR CORP·Filed 2019·Granted Nov 10, 2020·8 cites·34 claims
- 0689US7747062B2Methods, defect review tools, and systems for locating a defect in a defect review processKLA TENCOR TECH CORP·Filed 2005·Granted Jun 29, 2010·32 cites·30 claims
- 0789US7440607B1Outlier substrate inspectionKLA TENCOR CORP·Filed 2004·Granted Oct 21, 2008·45 cites·20 claims
- 0888US11047806B2Defect discovery and recipe optimization for inspection of three-dimensional semiconductor structuresKLA TENCOR CORP·Filed 2017·Granted Jun 29, 2021·8 cites·26 claims
- 0987US10395358B2High sensitivity repeater defect detectionKLA TENCOR CORP·Filed 2017·Granted Aug 27, 2019·7 cites·35 claims
- 1087US10151706B1Inspection for specimens with extensive die to die process variationKLA TENCOR CORP·Filed 2017·Granted Dec 11, 2018·5 cites·20 claims
- 1186US10192302B2Combined patch and design-based defect detectionKLA TENCOR CORP·Filed 2016·Granted Jan 29, 2019·5 cites·20 claims
- 1286US9087367B2Determining design coordinates for wafer defectsCHANG ELLIS·Filed 2012·Granted Jul 21, 2015·11 cites·27 claims
- 1384US9830421B2Alignment of inspection to design using built in targetsKLA TENCOR CORP·Filed 2015·Granted Nov 28, 2017·7 cites·26 claims
- 1482US9965848B2Shape based groupingKLA TENCOR CORP·Filed 2016·Granted May 8, 2018·4 cites·20 claims
- 1574US10325361B2System, method and computer program product for automatically generating a wafer image to design coordinate mappingKLA TENCOR CORP·Filed 2016·Granted Jun 18, 2019·2 cites·11 claims
- 1674US10127651B2Defect sensitivity of semiconductor wafer inspectors using design data with wafer image dataKLA TENCOR CORP·Filed 2016·Granted Nov 13, 2018·2 cites·20 claims
- 1774US9996942B2Sub-pixel alignment of inspection to designKLA TENCOR CORP·Filed 2016·Granted Jun 12, 2018·3 cites·22 claims
- 1850US2022059316A1Scanning Electron Microscope Image Anchoring to Design for ArrayKLA CORP·Filed 2021·Application pending·0 cites
- 1948US11151707B2System and method for difference filter and aperture selection using shallow deep learningKLA TENCOR CORP·Filed 2019·Granted Oct 19, 2021·0 cites·38 claims
- 2046US11049745B2Defect-location determination using correction loop for pixel alignmentKLA TENCOR CORP·Filed 2019·Granted Jun 29, 2021·0 cites·16 claims
- 2144US11450012B2BBP assisted defect detection flow for SEM imagesKLA CORP·Filed 2020·Granted Sep 20, 2022·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →