Inventor · disambiguated record
Lich Dang
Also filed as: DANG LICH X
1 granted patent·4 pending applications·2 citations·filing 2000–2005
19Inventor score
Top patents by PatentIndex Score
5 records- 0134US6675331B1Testable transparent latch and method for testing logic circuitry that includes a testable transparent latchTEXAS INSTRUMENTS INC·Filed 2000·Granted Jan 6, 2004·2 cites·12 claims
- 0219US2006242537A1Error detection in a logic device without performance impactDANG LICH X·Filed 2005·Application pending·0 cites
- 0318US2005149786A1Apparatus and method for determining threshold voltages in a flash memory unitFiled 2003·Application pending·0 cites
- 0418US2005138497A1Apparatus and method for testing a flash memory unitFiled 2003·Application pending·0 cites
- 0518US2005149785A1Apparatus and method for testing a flash memory unit using stress voltagesFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →