Inventor · disambiguated record
Chern-Jiann Lee
Also filed as: LEE CHERN-JIANN
5 granted patents·290 citations·filing 1995–2021
83Inventor score
Top patents by PatentIndex Score
5 records- 0194US5726920AWatchdog system having data differentiating means for use in monitoring of semiconductor wafer testing lineADVANCED MICRO DEVICES INC·Filed 1995·Granted Mar 10, 1998·158 cites·47 claims
- 0286US6830941B1Method and apparatus for identifying individual die during failure analysisADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 14, 2004·44 cites·3 claims
- 0381US6028994AMethod for predicting performance of microelectronic device based on electrical parameter test data using computer modelADVANCED MICRO DEVICES INC·Filed 1998·Granted Feb 22, 2000·67 cites·24 claims
- 0471US6516450B1Variable design rule toolADVANCED MICRO DEVICES INC·Filed 2000·Granted Feb 4, 2003·21 cites·21 claims
- 0538US11256020B1Light emitting structureLEE CHERN JIANN·Filed 2021·Granted Feb 22, 2022·0 cites·39 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →