Inventor · disambiguated record
Hiroyuki Kamada
Also filed as: KAMADA HIROYUKI
16 granted patents·8 pending applications·74 citations·filing 1999–2022
89Inventor score
Files withSHINETSU HANDOTAI KK10MATSUSHITA ELECTRIC INDUSTRIAL CO LTD5HOSHI RYOJI2ASTELLAS PHARMA INC1KAMADA HIROYUKI1
Top patents by PatentIndex Score
24 records- 0188US10400353B2Method for controlling resistivity and N-type silicon single crystalSHINETSU HANDOTAI KK·Filed 2015·Granted Sep 3, 2019·2 cites·6 claims
- 0285US7544899B2Printed circuit boardKEIHIN CORP·Filed 2005·Granted Jun 9, 2009·13 cites·6 claims
- 0379US6914000B2Polishing method, polishing system and process-managing systemMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Jul 5, 2005·25 cites·6 claims
- 0478US9111883B2Method for evaluating silicon single crystal and method for manufacturing silicon single crystalSHINETSU HANDOTAI KK·Filed 2012·Granted Aug 18, 2015·4 cites·6 claims
- 0576US9773710B2Method for evaluating concentration of defect in silicon single crystal substrateSHINETSU HANDOTAI KK·Filed 2014·Granted Sep 26, 2017·3 cites·8 claims
- 0667US9850595B2Method for heat treatment of silicon single crystal waferSHINETSU HANDOTAI KK·Filed 2015·Granted Dec 26, 2017·1 cites·6 claims
- 0766US6395598B1Semiconductor device and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted May 28, 2002·26 cites·9 claims
- 0858US2024141548A1Single crystal pulling apparatus and method for pulling single crystalSHINETSU HANDOTAI KK·Filed 2022·Application pending·0 cites
- 0956US2024076800A1Single crystal pulling apparatus and method for pulling single crystalSHINETSU HANDOTAI KK·Filed 2021·Application pending·0 cites
- 1053US12188153B2Single-crystal pulling apparatus with saddle-shaped superconducting coils and single-crystal pulling methodSHINETSU HANDOTAI KK·Filed 2021·Granted Jan 7, 2025·0 cites·6 claims
- 1152US10066322B2Method for heat treatment of silicon single crystal waferSHINETSU HANDOTAI KK·Filed 2017·Granted Sep 4, 2018·0 cites·5 claims
- 1252US9650725B2Method for manufacturing a defect-controlled low-oxygen concentration silicon single crystal waferSHINETSU HANDOTAI KK·Filed 2013·Granted May 16, 2017·0 cites·11 claims
- 1352US2024138690A1Arrhythmic state detection assisting device and programASTELLAS PHARMA INC·Filed 2021·Application pending·0 cites
- 1451US11081556B2Silicon carbide semiconductor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2020·Granted Aug 3, 2021·0 cites·19 claims
- 1551US7851316B2Fabrication method of semiconductor devicePANASONIC CORP·Filed 2009·Granted Dec 14, 2010·0 cites·8 claims
- 1650US12227872B2Single-crystal pulling apparatus and single-crystal pulling methodSHIN ETSU HANDOTAI CO LTD·Filed 2020·Granted Feb 18, 2025·0 cites·10 claims
- 1746US2013340671A1Silica glass crucible, method for manufacturing same, and method for manufacturing silicon single crystalKIMURA AKIHIRO·Filed 2012·Application pending·0 cites
- 1840US9938640B2Method for heat treatment of silicon single crystal waferSHINETSU HANDOTAI KK·Filed 2015·Granted Apr 10, 2018·0 cites·8 claims
- 1939US2006076558A1Semiconductor device and manufacturing method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 2038US7294569B2Semiconductor device fabrication method and semiconductor device fabrication system for minimizing film-thickness variationsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Nov 13, 2007·0 cites·6 claims
- 2138US2006183290A1Manufacturing method for semiconductor device and rapid thermal annealing apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 2238US2014379276A1Method for calculating nitrogen concentration in silicon single crystal and method for calculating resistivity shift amountHOSHI RYOJI·Filed 2012·Application pending·0 cites
- 2337US8247875B2Fabrication method of semiconductor deviceKAMADA HIROYUKI·Filed 2010·Granted Aug 21, 2012·0 cites·8 claims
- 2435US2013323153A1Silicon single crystal waferHOSHI RYOJI·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →