Inventor · disambiguated record
Toshihide Matsukawa
Also filed as: MATSUKAWA TOSHIHIDE
5 granted patents·6 pending applications·1 citations·filing 2014–2022
61Inventor score
Files withNIDEC READ CORP11
Top patents by PatentIndex Score
11 records- 0161US9910084B2Flexible circuit board inspecting apparatusNIDEC READ CORP·Filed 2015·Granted Mar 6, 2018·1 cites·20 claims
- 0256US2020257388A1Inspecting apparatusNIDEC-READ CORP·Filed 2020·Application pending·0 cites
- 0353US12131460B2Image processing apparatus, image processing method, and inspection apparatusNIDEC READ CORP·Filed 2022·Granted Oct 29, 2024·0 cites·19 claims
- 0452US10678385B2Inspecting apparatusNIDEC READ CORP·Filed 2017·Granted Jun 9, 2020·0 cites·5 claims
- 0551US2015086303A1Processing object transport system, and substrate inspection systemNIDEC READ CORP·Filed 2014·Application pending·0 cites
- 0650US12055580B2Circuit board inspecting apparatusNIDEC READ CORP·Filed 2021·Granted Aug 6, 2024·0 cites·12 claims
- 0745US12283509B2Load port adapterNIDEC READ CORP·Filed 2021·Granted Apr 22, 2025·0 cites·8 claims
- 0845US2016163576A1Processing object transport system, and substrate inspection systemNIDEC READ CORP·Filed 2016·Application pending·0 cites
- 0944US2015212625A1Touch panel inspecting apparatusNIDEC READ CORP·Filed 2015·Application pending·0 cites
- 1041US2015083449A1Contact apparatusNIDEC READ CORP·Filed 2014·Application pending·0 cites
- 1133US2015310161A1Method of designing circuit board inspecting jig, circuit board inspecting jig, and circuit board inspecting apparatusNIDEC READ CORP·Filed 2015·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →