Inventor · disambiguated record
Mark R. Thomann
Also filed as: THOMANN MARK · THOMANN MARK R
48 granted patents·1,419 citations·filing 1990–2019
99Inventor score
Top patents by PatentIndex Score
48 records- 0198US5128563ACMOS bootstrapped output driver method and circuitMICRON TECHNOLOGY INC·Filed 1990·Granted Jul 7, 1992·127 cites·41 claims
- 0294US6438060B1Method of reducing standby current during power down modeMICRON TECHNOLOGY INC·Filed 2001·Granted Aug 20, 2002·80 cites·20 claims
- 0394US5506814AVideo random access memory device and method implementing independent two WE nibble controlMICRON TECHNOLOGY INC·Filed 1993·Granted Apr 9, 1996·120 cites·37 claims
- 0493US6330194B1High speed I/O calibration using an input path and simplified logicMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 11, 2001·79 cites·66 claims
- 0592US5469393ACircuit and method for decreasing the cell margin during a test modeMICRON SEMICONDUCTOR INC·Filed 1993·Granted Nov 21, 1995·79 cites·22 claims
- 0691US6763444B2Read/write timing calibration of a memory array using a row or a redundant rowMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 13, 2004·68 cites·49 claims
- 0791US5544108ACircuit and method for decreasing the cell margin during a test modeMICRON TECHNOLOGY INC·Filed 1995·Granted Aug 6, 1996·75 cites·29 claims
- 0889US6836437B2Method of reducing standby current during power down modeMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 28, 2004·42 cites·20 claims
- 0988US8063650B2Testing fuse configurations in semiconductor devicesONG ADRIAN E·Filed 2008·Granted Nov 22, 2011·13 cites·24 claims
- 1088US6809990B2Delay locked loop control circuitMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 26, 2004·43 cites·48 claims
- 1188US5657289AExpandable data width SAM for a multiport RAMMICRON TECHNOLOGY INC·Filed 1995·Granted Aug 12, 1997·64 cites·8 claims
- 1285US6392453B1Differential input buffer bias circuitMICRON TECHNOLOGY INC·Filed 2001·Granted May 21, 2002·33 cites·48 claims
- 1384US5349247AEnhancement circuit and method for ensuring diactuation of a switching deviceMICRON TECHNOLOGY INC·Filed 1992·Granted Sep 20, 1994·32 cites·11 claims
- 1482US5703826AVideo random access memory chip configured to transfer data in response to an internal write signalMICRON TECHNOLOGY INC·Filed 1996·Granted Dec 30, 1997·46 cites·12 claims
- 1580US5329186ACMOS bootstrapped output driver method and circuitMICRON TECHNOLOGY INC·Filed 1992·Granted Jul 12, 1994·26 cites·13 claims
- 1679US5717647AExpandable data width sam for a multiport ramMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 10, 1998·36 cites·7 claims
- 1778US9568544B2Testing fuse configurations in semiconductor devicesRAMBUS INC·Filed 2014·Granted Feb 14, 2017·3 cites·17 claims
- 1874US6809974B2Controller for delay locked loop circuitsMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 26, 2004·18 cites·48 claims
- 1972US5442642ATest signal generator on substrate to testMICRON SEMICONDUCTOR INC·Filed 1992·Granted Aug 15, 1995·42 cites·19 claims
- 2069US6665219B2Method of reducing standby current during power down modeMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 16, 2003·13 cites·10 claims
- 2169US5699314AVideo random access memory device and method implementing independent two we nibble controlMICRON TECHNOLOGY INC·Filed 1996·Granted Dec 16, 1997·24 cites·7 claims
- 2267US6954388B2Delay locked loop control circuitMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 11, 2005·13 cites·52 claims
- 2367US5592488AMethod and apparatus for pipelined multiplexing employing analog delays for a multiport interfaceMICRON TECHNOLOGY INC·Filed 1995·Granted Jan 7, 1997·26 cites·7 claims
- 2466US5680595AProgrammable data port clocking system for clocking a plurality of data ports with a plurality of clocking signals in an asynchronous transfer mode systemMICRON TECHNOLOGY INC·Filed 1995·Granted Oct 21, 1997·25 cites·10 claims
- 2565US8717052B2Testing fuse configurations in semiconductor devicesONG ADRIAN E·Filed 2011·Granted May 6, 2014·1 cites·4 claims
- 2664US6694416B1Double data rate scheme for data outputMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 17, 2004·18 cites·36 claims
- 2764US5854800AMethod and apparatus for a high speed cyclical redundancy check systemMICRON TECHNOLOGY INC·Filed 1995·Granted Dec 29, 1998·39 cites·9 claims
- 2862US11009548B2Testing fuse configurations in semiconductor devicesRAMBUS INC·Filed 2019·Granted May 18, 2021·0 cites·20 claims
- 2962US6901013B2Controller for delay locked loop circuitsMICRON TECHNOLOGY INC·Filed 2001·Granted May 31, 2005·10 cites·41 claims
- 3062US5778007AMethod and circuit for transferring data with dynamic parity generation and checking scheme in multi-port DRAMMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 7, 1998·37 cites·10 claims
- 3161US5748635AMultiport datapath systemMICRON TECHNOLOGY INC·Filed 1996·Granted May 5, 1998·19 cites·12 claims
- 3260US5953258AData transfer in a memory device having complete row redundancyMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 14, 1999·16 cites·5 claims
- 3359US5815447AMemory device having complete row redundancyMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 29, 1998·35 cites·13 claims
- 3456US10302696B2Testing fuse configurations in semiconductor devicesRAMBUS INC·Filed 2016·Granted May 28, 2019·0 cites·20 claims
- 3554US7562268B2Method and apparatus for testing a memory device with compressed data using a single outputMICRON TECHNOLOGY INC·Filed 2005·Granted Jul 14, 2009·2 cites·17 claims
- 3653US6081528AShared buffer memory architecture for asynchronous transfer mode switching and multiplexing technologyMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 27, 2000·23 cites·11 claims
- 3751US5499250ASystem having multiple subsystems and test signal source resident upon common substrateMICRON TECHNOLOGY INC·Filed 1995·Granted Mar 12, 1996·18 cites·26 claims
- 3850US5783948AMethod and apparatus for enhanced booting and DC conditionsMICRON TECHNOLOGY INC·Filed 1996·Granted Jul 21, 1998·9 cites·27 claims
- 3949US5574390AMethod and apparatus for enhanced booting and DC conditionsMICRON TECHNOLOGY INC·Filed 1995·Granted Nov 12, 1996·10 cites·20 claims
- 4048US6201751B1Integrated circuit power-up controllers, integrated circuit power-up circuits, and integrated circuit power-up methodsMICRON TECHNOLOGY INC·Filed 1999·Granted Mar 13, 2001·10 cites·37 claims
- 4147US7251715B2Double data rate scheme for data outputMICRON TECHNOLOGY INC·Filed 2006·Granted Jul 31, 2007·1 cites·42 claims
- 4247US5945845AMethod and apparatus for enhanced booting and DC conditionsMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 31, 1999·7 cites·23 claims
- 4346US6976195B1Method and apparatus for testing a memory device with compressed data using a single outputMICRON TECHNOLOGY INC·Filed 1999·Granted Dec 13, 2005·8 cites·32 claims
- 4446US6487207B1Shared buffer memory architecture for asynchronous transfer mode switching and multiplexing technologyMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 26, 2002·18 cites·33 claims
- 4535US7093095B2Double data rate scheme for data outputMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 15, 2006·0 cites·62 claims
- 4634US5648974ASystem having multiple subsystems and test signal source resident upon common substrateMICRON TECHNOLOGY INC·Filed 1995·Granted Jul 15, 1997·4 cites·49 claims
- 4733US5964896AMethod and apparatus for a high speed cyclical redundancy check systemMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 12, 1999·3 cites·14 claims
- 4833US5838959AProgrammable data port clocking system with automatic disable and noise suppression for asynchronous transfer mode systemsMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 17, 1998·4 cites·14 claims
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