Inventor · disambiguated record
John E. Sheets, Ii
Also filed as: SHEETS II JOHN E · SHEETS II JOHN EDWARDS · SHEETS JOHN · SHEETS JOHN E II
24 granted patents·3 pending applications·80 citations·filing 2001–2021
93Inventor score
Top patents by PatentIndex Score
27 records- 0196US8300450B2Implementing physically unclonable function (PUF) utilizing EDRAM memory cell capacitance variationCHRISTENSEN TODD ALAN·Filed 2010·Granted Oct 30, 2012·41 cites·20 claims
- 0291US9520876B1Power gating and clock gating in wiring levelsIBM·Filed 2016·Granted Dec 13, 2016·14 cites·19 claims
- 0390US8531203B2Mask alignment, rotation and bias monitor utilizing threshold voltage dependenceCHRISTENSEN TODD A·Filed 2010·Granted Sep 10, 2013·14 cites·20 claims
- 0489US9455251B1Decoupling capacitor using finFET topologyIBM·Filed 2015·Granted Sep 27, 2016·6 cites·20 claims
- 0584US10468491B1Low resistance contact for transistorsIBM·Filed 2018·Granted Nov 5, 2019·3 cites·10 claims
- 0669US10580730B2Managed integrated circuit power supply distributionIBM·Filed 2017·Granted Mar 3, 2020·2 cites·12 claims
- 0764US10943972B2Precision BEOL resistorsIBM·Filed 2019·Granted Mar 9, 2021·0 cites·18 claims
- 0864US10784159B2Semiconductor device and method of forming the semiconductor deviceIBM·Filed 2019·Granted Sep 22, 2020·0 cites·17 claims
- 0961US11171064B2Metalization repair in semiconductor wafersIBM·Filed 2018·Granted Nov 9, 2021·0 cites·18 claims
- 1061US10923575B2Low resistance contact for transistorsIBM·Filed 2019·Granted Feb 16, 2021·0 cites·9 claims
- 1161US10256145B2Semiconductor device and method of forming the semiconductor deviceIBM·Filed 2017·Granted Apr 9, 2019·0 cites·18 claims
- 1260US10332956B2Precision beol resistorsIBM·Filed 2017·Granted Jun 25, 2019·0 cites·10 claims
- 1360US10332955B2Precision BEOL resistorsIBM·Filed 2017·Granted Jun 25, 2019·0 cites·10 claims
- 1459US10361265B2Precision BEOL resistorsIBM·Filed 2017·Granted Jul 23, 2019·0 cites·10 claims
- 1559US10340330B2Precision BEOL resistorsIBM·Filed 2017·Granted Jul 2, 2019·0 cites·10 claims
- 1658US12406119B2Processor chip timing adjustment enhancementIBM·Filed 2021·Granted Sep 2, 2025·0 cites·20 claims
- 1758US11018084B2Managed integrated circuit power supply distributionIBM·Filed 2019·Granted May 25, 2021·0 cites·20 claims
- 1857US11171063B2Metalization repair in semiconductor wafersIBM·Filed 2017·Granted Nov 9, 2021·0 cites·7 claims
- 1957US9966308B2Semiconductor device and method of forming the semiconductor deviceIBM·Filed 2016·Granted May 8, 2018·0 cites·12 claims
- 2055US10699950B2Method of optimizing wire RC for device performance and reliabilityELPIS TECH INC·Filed 2018·Granted Jun 30, 2020·0 cites·20 claims
- 2154US9997408B2Method of optimizing wire RC for device performance and reliabilityIBM·Filed 2015·Granted Jun 12, 2018·0 cites·20 claims
- 2253US2018096858A1Metalization repair in semiconductor wafersIBM·Filed 2016·Application pending·0 cites
- 2351US9405311B1Bias-temperature induced damage mitigation circuitIBM·Filed 2015·Granted Aug 2, 2016·0 cites·15 claims
- 2450US2007128740A1Polysilicon Conductor Width Measurement for 3-Dimensional FETsIBM·Filed 2007·Application pending·0 cites
- 2548US9401643B1Bias-temperature induced damage mitigation circuitIBM·Filed 2015·Granted Jul 26, 2016·0 cites·20 claims
- 2640US9570388B2FinFET power supply decouplingIBM·Filed 2015·Granted Feb 14, 2017·0 cites·16 claims
- 2734US2003058675A1Silicon-on-insulator SRAM cells with increased stability and yieldIBM·Filed 2001·Application pending·0 cites
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