Inventor · disambiguated record
Stephen Bradley Ippolito
Also filed as: IPPOLITO STEPHEN · IPPOLITO STEPHEN B · IPPOLITO STEPHEN BRADLEY
10 granted patents·2 pending applications·75 citations·filing 2000–2018
86Inventor score
Top patents by PatentIndex Score
12 records- 0185US6687058B1Numerical aperature increasing lens (nail) techniques for high-resolution sub-surface imagingUNIV BOSTON·Filed 2000·Granted Feb 3, 2004·21 cites·52 claims
- 0284US10260914B1Fiber optic displacement sensorANGSTROM SCIENCE INC·Filed 2018·Granted Apr 16, 2019·6 cites·4 claims
- 0380US7110118B2Spectral imaging for vertical sectioningUNIV BOSTON·Filed 2001·Granted Sep 19, 2006·35 cites·28 claims
- 0477US8248097B2Method and apparatus for probing a waferIPPOLITO STEPHEN BRADLEY·Filed 2009·Granted Aug 21, 2012·8 cites·7 claims
- 0572US9797922B2Scanning probe microscope head designANGSTROM SCIENCE INC·Filed 2016·Granted Oct 24, 2017·1 cites·8 claims
- 0671US9366695B2Scanning probe microscope head designANGSTROM SCIENCE INC·Filed 2015·Granted Jun 14, 2016·2 cites·17 claims
- 0769US9869696B2Method for imaging a feature using a scanning probe microscopeDCG SYSTEMS INC·Filed 2016·Granted Jan 16, 2018·1 cites·22 claims
- 0850US7826045B2Angular spectrum tailoring in solid immersion microscopy for circuit analysisIBM·Filed 2008·Granted Nov 2, 2010·1 cites·14 claims
- 0949US9310429B2Method and apparatus for probing a waferIPPOLITO STEPHEN BRADLEY·Filed 2012·Granted Apr 12, 2016·0 cites·9 claims
- 1047US7961307B2Angular spectrum tailoring in solid immersion microscopy for circuit analysisIBM·Filed 2010·Granted Jun 14, 2011·0 cites·6 claims
- 1131US2017003336A1Diamond delayering for electrical probingDCG SYSTEMS INC·Filed 2016·Application pending·0 cites
- 1227US2015338627A1Apparatus and method for atomic force, near-field scanning optical microscopyMULTIPROBE INC·Filed 2015·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Stephen Bradley Ippolito files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →