Inventor · disambiguated record
Martin Schönleber
Also filed as: SCHONLEBER MARTIN · SCHÖNLEBER MARTIN
14 granted patents·1 pending application·131 citations·filing 2012–2019
92Inventor score
Top patents by PatentIndex Score
15 records- 0194US8982339B2Material-working device with in-situ measurement of the working distancePRECITEC OPTRONIK GMBH·Filed 2012·Granted Mar 17, 2015·36 cites·17 claims
- 0293US10731965B1Phosphor light source for CLS or multipointPRECITEC OPTRONIK GMBH·Filed 2019·Granted Aug 4, 2020·8 cites·11 claims
- 0392US10228551B1Device and method for optically measuring a measurement objectPRECITEC OPTRONIK GMBH·Filed 2018·Granted Mar 12, 2019·23 cites·16 claims
- 0491US9677871B2Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring headPRECITEC OPTRONIK GMBH·Filed 2015·Granted Jun 13, 2017·10 cites·15 claims
- 0590US10444521B2Device for machining material by means of laser radiationPRECITEC GMBH & CO KG·Filed 2016·Granted Oct 15, 2019·9 cites·19 claims
- 0690US9494409B2Test device for testing a bonding layer between wafer-shaped samples and test process for testing the bonding layerSCHÖNLEBER MARTIN·Filed 2012·Granted Nov 15, 2016·15 cites·4 claims
- 0789US9982994B2Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring headPRECITEC OPTRONIK GMBH·Filed 2017·Granted May 29, 2018·7 cites·27 claims
- 0888US10234265B2Distance measuring device and method for measuring distancesPRECITEC OPTRONIK GMBH·Filed 2017·Granted Mar 19, 2019·6 cites·20 claims
- 0988US9297645B2Apparatus and method for determining a depth of a region having a high aspect ratio that protrudes into a surface of a semiconductor waferSCHÖNLEBER MARTIN·Filed 2012·Granted Mar 29, 2016·11 cites·26 claims
- 1079US10967452B2Device for measuring the depth of a weld seam in real timePRECITEC GMBH & CO KG·Filed 2015·Granted Apr 6, 2021·2 cites·11 claims
- 1177US11079218B2Measuring distance using a laser processing system with optical amplifier for amplifying measuring beam or reflected part of measurement beamPRECITEC GMBH & CO KG·Filed 2019·Granted Aug 3, 2021·1 cites·10 claims
- 1275US10260941B2Chromatic confocal distance sensorPRECITEC OPTRONIK GMBH·Filed 2016·Granted Apr 16, 2019·3 cites·13 claims
- 1360US11219967B2Machining head for a laser machining devicePRECITEC OPTRONIK GMBH·Filed 2019·Granted Jan 11, 2022·0 cites·11 claims
- 1447US11027364B2Method and device for measuring the depth of the vapor capillary during a machining process with a high-energy beamPRECITEC OPTRONIK GMBH·Filed 2016·Granted Jun 8, 2021·0 cites·20 claims
- 1533US2016202045A1Method of measuring the depth of penetration of a laser beam into a workpiecePRECITEC OPTRONIK GMBH·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →