Inventor · disambiguated record
Lloyd M. Berken
Also filed as: BERKEN LLOYD · BERKEN LLOYD M
7 granted patents·1,252 citations·filing 1994–2010
90Inventor score
Top patents by PatentIndex Score
7 records- 0195US6413321B1Method and apparatus for reducing particle contamination on wafer backside during CVD processAPPLIED MATERIALS INC·Filed 2000·Granted Jul 2, 2002·679 cites·6 claims
- 0293US7922971B2Integrated meter for analyzing biological samplesABBOTT DIABETES CARE INC·Filed 2006·Granted Apr 12, 2011·29 cites·26 claims
- 0393US5980194AWafer position error detection and correction systemAPPLIED MATERIALS INC·Filed 1996·Granted Nov 9, 1999·232 cites·31 claims
- 0492US5563798AWafer positioning systemAPPLIED MATERIALS INC·Filed 1994·Granted Oct 8, 1996·201 cites·41 claims
- 0588US5740062AWafer positioning systemAPPLIED MATERIALS INC·Filed 1996·Granted Apr 14, 1998·105 cites·3 claims
- 0678US8435447B2Integrated meter for analyzing biological samplesBRYER PHILIP·Filed 2010·Granted May 7, 2013·3 cites·26 claims
- 0772US8815175B2Integrated meter for analyzing biological samplesBRYER PHILIP·Filed 2009·Granted Aug 26, 2014·3 cites·22 claims
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