Inventor · disambiguated record
Tien-Yan Ma
Also filed as: MA TIEN-YAN
3 granted patents·4 citations·filing 2018–2023
54Inventor score
Files withIND TECH RES INST3
Top patents by PatentIndex Score
3 records- 0178US11961258B2Calibration method for optical see-through display and calibration systemIND TECH RES INST·Filed 2023·Granted Apr 16, 2024·1 cites·18 claims
- 0274US10977829B2Depth camera calibration device and method thereofIND TECH RES INST·Filed 2018·Granted Apr 13, 2021·3 cites·13 claims
- 0354US12499569B2Measurement card, measurement system and measurement method using the sameIND TECH RES INST·Filed 2023·Granted Dec 16, 2025·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →