Inventor · disambiguated record
Shingo Yorisaki
Also filed as: YORISAKI SHINGO
8 granted patents·4 pending applications·202 citations·filing 1990–2011
86Inventor score
Top patents by PatentIndex Score
12 records- 0189US5219765AMethod for manufacturing a semiconductor device including wafer aging, probe inspection, and feeding back the results of the inspection to the device fabrication processHITACHI LTD·Filed 1990·Granted Jun 15, 1993·160 cites·22 claims
- 0287US7776626B2Manufacturing method of semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2005·Granted Aug 17, 2010·15 cites·24 claims
- 0385US7271015B2Manufacturing method of semiconductor integrated circuit device and probe cardRENESAS TECH CORP·Filed 2005·Granted Sep 18, 2007·12 cites·3 claims
- 0483US8357933B2Manufacturing method of semiconductor integrated circuit deviceRENESAS ELECTRONICS CORP·Filed 2010·Granted Jan 22, 2013·6 cites·20 claims
- 0572US7901958B2Fabrication method of semiconductor integrated circuit deviceRENESAS ELECTRONICS CORP·Filed 2010·Granted Mar 8, 2011·2 cites·18 claims
- 0665US7407823B2Manufacturing method of semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2006·Granted Aug 5, 2008·2 cites·26 claims
- 0752US7517707B2Manufacturing method of semiconductor integrated circuit device and probe cardRENESAS TECH CORP·Filed 2007·Granted Apr 14, 2009·1 cites·7 claims
- 0852US2008020498A1Fabrication method of semiconductor integrated circuit deviceOKAMOTO MASAYOSHI·Filed 2007·Application pending·0 cites
- 0950US2011175634A1Fabrication method of semiconductor integrated circuit deviceOKAMOTO MASAYOSHI·Filed 2011·Application pending·0 cites
- 1050US2011136272A1Fabrication method of semiconductor integrated circuit deviceOKAMOTO MASAYOSHI·Filed 2011·Application pending·0 cites
- 1148US7598100B2Manufacturing method of semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2004·Granted Oct 6, 2009·4 cites·21 claims
- 1242US2005093565A1Fabrication method of semiconductor integrated circuit deviceFiled 2004·Application pending·0 cites
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