Inventor · disambiguated record

Jchung-Chang Chen

Also filed as: CHEN JCHUNG-CHANG

1 granted patent·20 citations·filing 2004–2004

40Inventor score

Technology areasH10W

Files withCHEN KEI-WEI1

Top patents by PatentIndex Score

1 record

0168US7071100B2Method of forming barrier layer with reduced resistivity and improved reliability in copper damascene processCHEN KEI-WEI·Filed 2004·Granted Jul 4, 2006·20 cites·22 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →