Inventor · disambiguated record
Amos Gvirtzman
Also filed as: GVIRTZMAN AMOS
13 granted patents·849 citations·filing 1998–2012
94Inventor score
Top patents by PatentIndex Score
13 records- 0198US7551719B2Multifunction X-ray analysis systemJORDAN VALLEY SEMICONDUCTORS·Filed 2005·Granted Jun 23, 2009·120 cites·36 claims
- 0296US6556652B1Measurement of critical dimensions using X-raysJORDAN VALLEY APPLIED RADIATION LTD·Filed 2000·Granted Apr 29, 2003·89 cites·40 claims
- 0395US6895075B2X-ray reflectometry with small-angle scattering measurementJORDAN VALLEY APPLIED RADIATION LTD·Filed 2003·Granted May 17, 2005·132 cites·23 claims
- 0494US6680996B2Dual-wavelength X-ray reflectometryJORDAN VALLEY APPLIED RADIATION LTD·Filed 2002·Granted Jan 20, 2004·55 cites·34 claims
- 0594US6381303B1X-ray microanalyzer for thin filmsJORDAN VALLEY APPLIED RADIATION LTD·Filed 1999·Granted Apr 30, 2002·178 cites·26 claims
- 0693US8243878B2High-resolution X-ray diffraction measurement with enhanced sensitivityYOKHIN BORIS·Filed 2010·Granted Aug 14, 2012·22 cites·42 claims
- 0791US6108398AX-ray microfluorescence analyzerJORDAN VALLEY APPLIED RADIATION LTD·Filed 1998·Granted Aug 22, 2000·108 cites·13 claims
- 0888US8731138B2High-resolution X-ray diffraction measurement with enhanced sensitivityYOKHIN BORIS·Filed 2012·Granted May 20, 2014·8 cites·16 claims
- 0988US7068753B2Enhancement of X-ray reflectometry by measurement of diffuse reflectionsJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Jun 27, 2006·28 cites·21 claims
- 1086US7231016B2Efficient measurement of diffuse X-ray reflectionsJORDAN VALLEY APPLIED RADIATION LTD·Filed 2006·Granted Jun 12, 2007·9 cites·16 claims
- 1186US6389102B2X-ray array detectorJORDAN VALLEY APPLIED RADIATION LTD·Filed 1999·Granted May 14, 2002·89 cites·29 claims
- 1267US6907108B2Dual-wavelength x-ray monochromatorJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Jun 14, 2005·5 cites·4 claims
- 1338US6184686B1Contamination and residuals inspection systemJORDAN VALLEY APPLIED RADIATION LTD·Filed 1998·Granted Feb 6, 2001·6 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →