Inventor · disambiguated record
Isaac Mazor
Also filed as: MAZOR ISAAC
41 granted patents·2 pending applications·1,938 citations·filing 1990–2017
98Inventor score
Files withJORDAN VALLEY APPLIED RADIATION LTD20JORDAN VALLEY SEMICONDUCTORS8JORDAN VALLEY SEMICONDUCTORS LTD5KLA INSTR CORP2MAZOR ISAAC2
Top patents by PatentIndex Score
43 records- 0198US7551719B2Multifunction X-ray analysis systemJORDAN VALLEY SEMICONDUCTORS·Filed 2005·Granted Jun 23, 2009·120 cites·36 claims
- 0298US5112129AMethod of image enhancement for the coherence probe microscope with applications to integrated circuit metrologyKLA INSTR CORP·Filed 1990·Granted May 12, 1992·306 cites·14 claims
- 0397US7120228B2Combined X-ray reflectometer and diffractometerJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Oct 10, 2006·131 cites·18 claims
- 0496US9551677B2Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)JORDAN VALLEY SEMICONDUCTORS LTD·Filed 2014·Granted Jan 24, 2017·26 cites·20 claims
- 0596US6556652B1Measurement of critical dimensions using X-raysJORDAN VALLEY APPLIED RADIATION LTD·Filed 2000·Granted Apr 29, 2003·89 cites·40 claims
- 0696US6512814B2X-ray reflectometerJORDAN VALLEY APPLIED RADIATION LTD·Filed 2001·Granted Jan 28, 2003·90 cites·5 claims
- 0796US5438413AProcess for measuring overlay misregistration during semiconductor wafer fabricationKLA INSTR CORP·Filed 1993·Granted Aug 1, 1995·180 cites·12 claims
- 0895US7483513B2Measurement of properties of thin films on sidewallsJORDAN VALLEY SEMICONDUCTORS·Filed 2006·Granted Jan 27, 2009·26 cites·40 claims
- 0995US7110491B2Measurement of critical dimensions using X-ray diffraction in reflection modeJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Sep 19, 2006·57 cites·34 claims
- 1095US6639968B2X-ray reflectometerJORDAN VALLEY APPLIED RADIATION LTD·Filed 2002·Granted Oct 28, 2003·71 cites·31 claims
- 1194US9606073B2X-ray scatterometry apparatusJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Mar 28, 2017·17 cites·20 claims
- 1294US7113566B1Enhancing resolution of X-ray measurements by sample motionJORDAN VALLEY APPLIED RADIATION LTD·Filed 2005·Granted Sep 26, 2006·31 cites·14 claims
- 1394US6680996B2Dual-wavelength X-ray reflectometryJORDAN VALLEY APPLIED RADIATION LTD·Filed 2002·Granted Jan 20, 2004·55 cites·34 claims
- 1494US6381303B1X-ray microanalyzer for thin filmsJORDAN VALLEY APPLIED RADIATION LTD·Filed 1999·Granted Apr 30, 2002·178 cites·26 claims
- 1593US8243878B2High-resolution X-ray diffraction measurement with enhanced sensitivityYOKHIN BORIS·Filed 2010·Granted Aug 14, 2012·22 cites·42 claims
- 1693US7653174B2Inspection of small features using X-ray fluorescenceJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Jan 26, 2010·29 cites·12 claims
- 1792US7481579B2Overlay metrology using X-raysJORDAN VALLEY APPLIED RADIATION LTD·Filed 2006·Granted Jan 27, 2009·23 cites·12 claims
- 1892US6453002B1Differential measurement of X-ray microfluorescenceJORDAN VALLEY APPLIED RADIATION LTD·Filed 2000·Granted Sep 17, 2002·44 cites·33 claims
- 1991US9829448B2Measurement of small features using XRFJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Nov 28, 2017·8 cites·20 claims
- 2091US6108398AX-ray microfluorescence analyzerJORDAN VALLEY APPLIED RADIATION LTD·Filed 1998·Granted Aug 22, 2000·108 cites·13 claims
- 2188US8731138B2High-resolution X-ray diffraction measurement with enhanced sensitivityYOKHIN BORIS·Filed 2012·Granted May 20, 2014·8 cites·16 claims
- 2288US7245695B2Detection of dishing and tilting using X-ray fluorescenceJORDAN VALLEY APPLIED RADIATION LTD·Filed 2005·Granted Jul 17, 2007·14 cites·25 claims
- 2388US7068753B2Enhancement of X-ray reflectometry by measurement of diffuse reflectionsJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Jun 27, 2006·28 cites·21 claims
- 2486US7231016B2Efficient measurement of diffuse X-ray reflectionsJORDAN VALLEY APPLIED RADIATION LTD·Filed 2006·Granted Jun 12, 2007·9 cites·16 claims
- 2586US6947520B2Beam centering and angle calibration for X-ray reflectometryJORDAN VALLEY APPLIED RADIATION LTD·Filed 2002·Granted Sep 20, 2005·27 cites·42 claims
- 2686US6389102B2X-ray array detectorJORDAN VALLEY APPLIED RADIATION LTD·Filed 1999·Granted May 14, 2002·89 cites·29 claims
- 2785US10386313B2Closed-loop control of X-ray knife edgeBRUKER JV ISRAEL LTD·Filed 2017·Granted Aug 20, 2019·3 cites·16 claims
- 2884US7023954B2Optical alignment of X-ray microanalyzersJORDAN VALLEY APPLIED RADIATION LTD·Filed 2003·Granted Apr 4, 2006·25 cites·12 claims
- 2983US7453985B2Control of X-ray beam spot sizeJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Nov 18, 2008·7 cites·17 claims
- 3082US9632043B2Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRFJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Apr 25, 2017·7 cites·20 claims
- 3181US7649978B2Automated selection of X-ray reflectometry measurement locationsJORDAN VALLEY SEMICONDUCTORS·Filed 2008·Granted Jan 19, 2010·7 cites·20 claims
- 3280US6895071B2XRR detector readout processingJORDON VALLEY APPLIED RADIATIO·Filed 2003·Granted May 17, 2005·23 cites·17 claims
- 3376US9389192B2Estimation of XRF intensity from an array of micro-bumpsJORDAN VALLEY SEMICONDUCTORS·Filed 2014·Granted Jul 12, 2016·2 cites·17 claims
- 3473US7804934B2Accurate measurement of layer dimensions using XRFJORDAN VALLEY SEMICONDUCTORS·Filed 2008·Granted Sep 28, 2010·5 cites·18 claims
- 3567US6907108B2Dual-wavelength x-ray monochromatorJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Jun 14, 2005·5 cites·4 claims
- 3667US6351516B1Detection of voids in semiconductor wafer processingJORDAN VALLEY APPLIED RADIATION LTD·Filed 1999·Granted Feb 26, 2002·35 cites·21 claims
- 3762US9666322B2X-ray source assemblyJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2014·Granted May 30, 2017·2 cites·16 claims
- 3862US5740953AMethod and apparatus for cleaving semiconductor wafersSELA SEMICONDUCTOR ENG LABORATORIES·Filed 1992·Granted Apr 21, 1998·24 cites·10 claims
- 3954US8565379B2Combining X-ray and VUV analysis of thin film layersMAZOR ISAAC·Filed 2012·Granted Oct 22, 2013·1 cites·12 claims
- 4048US2003002620A1Wafer with overlay test patternFiled 2002·Application pending·0 cites
- 4146US2007274447A1Automated selection of X-ray reflectometry measurement locationsMAZOR ISAAC·Filed 2007·Application pending·0 cites
- 4243US9390984B2X-ray inspection of bumps on a semiconductor substrateJORDAN VALLEY SEMICONDUCTORS·Filed 2012·Granted Jul 12, 2016·0 cites·14 claims
- 4338US6184686B1Contamination and residuals inspection systemJORDAN VALLEY APPLIED RADIATION LTD·Filed 1998·Granted Feb 6, 2001·6 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →