Inventor · disambiguated record
Boris Yokhin
Also filed as: YOKHIN BORIS
37 granted patents·2 pending applications·1,678 citations·filing 1998–2012
98Inventor score
Files withJORDAN VALLEY APPLIED RADIATION LTD24JORDAN VALLEY SEMICONDUCTORS9YOKHIN BORIS2JORDON VALLEY APPLIED RADIATIO1MAZOR ISAAC1
Top patents by PatentIndex Score
39 records- 0198US7551719B2Multifunction X-ray analysis systemJORDAN VALLEY SEMICONDUCTORS·Filed 2005·Granted Jun 23, 2009·120 cites·36 claims
- 0297US7120228B2Combined X-ray reflectometer and diffractometerJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Oct 10, 2006·131 cites·18 claims
- 0396US6556652B1Measurement of critical dimensions using X-raysJORDAN VALLEY APPLIED RADIATION LTD·Filed 2000·Granted Apr 29, 2003·89 cites·40 claims
- 0496US6512814B2X-ray reflectometerJORDAN VALLEY APPLIED RADIATION LTD·Filed 2001·Granted Jan 28, 2003·90 cites·5 claims
- 0595US7680243B2X-ray measurement of properties of nano-particlesJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Mar 16, 2010·55 cites·16 claims
- 0695US7483513B2Measurement of properties of thin films on sidewallsJORDAN VALLEY SEMICONDUCTORS·Filed 2006·Granted Jan 27, 2009·26 cites·40 claims
- 0795US7110491B2Measurement of critical dimensions using X-ray diffraction in reflection modeJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Sep 19, 2006·57 cites·34 claims
- 0895US6895075B2X-ray reflectometry with small-angle scattering measurementJORDAN VALLEY APPLIED RADIATION LTD·Filed 2003·Granted May 17, 2005·132 cites·23 claims
- 0995US6639968B2X-ray reflectometerJORDAN VALLEY APPLIED RADIATION LTD·Filed 2002·Granted Oct 28, 2003·71 cites·31 claims
- 1094US7113566B1Enhancing resolution of X-ray measurements by sample motionJORDAN VALLEY APPLIED RADIATION LTD·Filed 2005·Granted Sep 26, 2006·31 cites·14 claims
- 1194US7076024B2X-ray apparatus with dual monochromatorsJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Jul 11, 2006·61 cites·36 claims
- 1294US6680996B2Dual-wavelength X-ray reflectometryJORDAN VALLEY APPLIED RADIATION LTD·Filed 2002·Granted Jan 20, 2004·55 cites·34 claims
- 1394US6381303B1X-ray microanalyzer for thin filmsJORDAN VALLEY APPLIED RADIATION LTD·Filed 1999·Granted Apr 30, 2002·178 cites·26 claims
- 1493US8437450B2Fast measurement of X-ray diffraction from tilted layersWALL JOHN·Filed 2010·Granted May 7, 2013·23 cites·16 claims
- 1593US8243878B2High-resolution X-ray diffraction measurement with enhanced sensitivityYOKHIN BORIS·Filed 2010·Granted Aug 14, 2012·22 cites·42 claims
- 1693US7653174B2Inspection of small features using X-ray fluorescenceJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Jan 26, 2010·29 cites·12 claims
- 1792US7600916B2Target alignment for X-ray scattering measurementsJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Oct 13, 2009·21 cites·20 claims
- 1892US7481579B2Overlay metrology using X-raysJORDAN VALLEY APPLIED RADIATION LTD·Filed 2006·Granted Jan 27, 2009·23 cites·12 claims
- 1992US6453002B1Differential measurement of X-ray microfluorescenceJORDAN VALLEY APPLIED RADIATION LTD·Filed 2000·Granted Sep 17, 2002·44 cites·33 claims
- 2091US7103142B1Material analysis using multiple X-ray reflectometry modelsJORDAN VALLEY APPLIED RADIATION LTD·Filed 2005·Granted Sep 5, 2006·19 cites·30 claims
- 2191US6108398AX-ray microfluorescence analyzerJORDAN VALLEY APPLIED RADIATION LTD·Filed 1998·Granted Aug 22, 2000·108 cites·13 claims
- 2288US8731138B2High-resolution X-ray diffraction measurement with enhanced sensitivityYOKHIN BORIS·Filed 2012·Granted May 20, 2014·8 cites·16 claims
- 2388US7245695B2Detection of dishing and tilting using X-ray fluorescenceJORDAN VALLEY APPLIED RADIATION LTD·Filed 2005·Granted Jul 17, 2007·14 cites·25 claims
- 2488US7068753B2Enhancement of X-ray reflectometry by measurement of diffuse reflectionsJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Jun 27, 2006·28 cites·21 claims
- 2586US7231016B2Efficient measurement of diffuse X-ray reflectionsJORDAN VALLEY APPLIED RADIATION LTD·Filed 2006·Granted Jun 12, 2007·9 cites·16 claims
- 2686US6947520B2Beam centering and angle calibration for X-ray reflectometryJORDAN VALLEY APPLIED RADIATION LTD·Filed 2002·Granted Sep 20, 2005·27 cites·42 claims
- 2786US6389102B2X-ray array detectorJORDAN VALLEY APPLIED RADIATION LTD·Filed 1999·Granted May 14, 2002·89 cites·29 claims
- 2881US7649978B2Automated selection of X-ray reflectometry measurement locationsJORDAN VALLEY SEMICONDUCTORS·Filed 2008·Granted Jan 19, 2010·7 cites·20 claims
- 2980US6895071B2XRR detector readout processingJORDON VALLEY APPLIED RADIATIO·Filed 2003·Granted May 17, 2005·23 cites·17 claims
- 3078US7035375B2X-ray scattering with a polychromatic sourceJORDAN VALLEY APPLIED RADIATION LTD·Filed 2003·Granted Apr 25, 2006·14 cites·50 claims
- 3175US7321652B2Multi-detector EDXRDJORDAN VALLEY SEMICONDUCTORS·Filed 2006·Granted Jan 22, 2008·4 cites·16 claims
- 3274US6041095AX-ray fluorescence analyzerJORDAN VALLEY APPLIED RADIATION LTD·Filed 1998·Granted Mar 21, 2000·39 cites·20 claims
- 3373US7804934B2Accurate measurement of layer dimensions using XRFJORDAN VALLEY SEMICONDUCTORS·Filed 2008·Granted Sep 28, 2010·5 cites·18 claims
- 3473US7474732B2Calibration of X-ray reflectometry systemJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Jan 6, 2009·12 cites·108 claims
- 3572US6535575B2Pulsed X-ray reflectometerJORDAN VALLEY APPLIED RADIATION LTD·Filed 2002·Granted Mar 18, 2003·9 cites·14 claims
- 3667US6907108B2Dual-wavelength x-ray monochromatorJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Jun 14, 2005·5 cites·4 claims
- 3748US2003002620A1Wafer with overlay test patternFiled 2002·Application pending·0 cites
- 3846US2007274447A1Automated selection of X-ray reflectometry measurement locationsMAZOR ISAAC·Filed 2007·Application pending·0 cites
- 3943US9390984B2X-ray inspection of bumps on a semiconductor substrateJORDAN VALLEY SEMICONDUCTORS·Filed 2012·Granted Jul 12, 2016·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →