Inventor · disambiguated record
Chung-Min Lin
Also filed as: LIN CHUNG-MIN
8 granted patents·1 pending application·78 citations·filing 1997–2011
85Inventor score
Top patents by PatentIndex Score
9 records- 0172US6025263AUnderlayer process for high O3 /TEOS interlayer dielectric depositionNANYA TECHNOLOGY CORP·Filed 1997·Granted Feb 15, 2000·43 cites·13 claims
- 0271US6834547B2Humidity sensor and fabrication method thereofNANYA TECHNOLOGY CORP·Filed 2003·Granted Dec 28, 2004·11 cites·11 claims
- 0364US6575820B2Chemical mechanical polishing apparatusNANYA TECHNOLOGY CORP·Filed 2002·Granted Jun 10, 2003·10 cites·7 claims
- 0457US6178783B1Yarn feeder for knitting machineFiled 2000·Granted Jan 30, 2001·6 cites·11 claims
- 0550US8643151B2Passivation layer for semiconductor devicesLIU JEN-HAO·Filed 2011·Granted Feb 4, 2014·1 cites·20 claims
- 0643US6745631B2Method of measuring pore depth on the surface of a polishing padNANYA TECHNOLOGY CORP·Filed 2003·Granted Jun 8, 2004·0 cites·6 claims
- 0741US6920796B2Device used for detecting clamping force of processed object and method thereofNANYA TECHNOLOGY CORP·Filed 2003·Granted Jul 26, 2005·1 cites·32 claims
- 0833US2004068818A1Cleaning apparatus and rollerNANYA TECHNOLOGY CORP·Filed 2003·Application pending·0 cites
- 0931US6153482AMethod for fabricating LOCOS isolation having a planar surface which includes having the polish stop layer at a lower level than the LOCOS formationNANYA TECHNOLOGY CORP·Filed 1998·Granted Nov 28, 2000·6 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →