Inventor · disambiguated record

Michael Cull

Also filed as: CULL MICHAEL

2 granted patents·49 citations·filing 2002–2002

64Inventor score

Technology areasH01J

Files withKLA TENCOR TECH CORP2

Top patents by PatentIndex Score

2 records

0185US6943350B2Methods and apparatus for electron beam inspection of samplesKLA TENCOR TECH CORP·Filed 2002·Granted Sep 13, 2005·29 cites·18 claims
0281US6677586B1Methods and apparatus for electron beam inspection of samplesKLA TENCOR TECH CORP·Filed 2002·Granted Jan 13, 2004·20 cites·23 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →