Inventor · disambiguated record
Otto A. Torreiter
Also filed as: TORREITER OTTO · TORREITER OTTO A · TORREITER OTTO ANDREAS
40 granted patents·1 pending application·235 citations·filing 1992–2023
97Inventor score
Top patents by PatentIndex Score
41 records- 0191US9217758B2Ball grid array configuration for reliable testingIBM·Filed 2014·Granted Dec 22, 2015·7 cites·6 claims
- 0288US9977053B2Wafer probe alignmentIBM·Filed 2016·Granted May 22, 2018·4 cites·10 claims
- 0387US8535956B2Chip attach frameECKERT MARTIN·Filed 2012·Granted Sep 17, 2013·7 cites·6 claims
- 0487US5742616ASystem and method testing computer memoriesIBM·Filed 1995·Granted Apr 21, 1998·82 cites·14 claims
- 0586US9740813B1Layout effect characterization for integrated circuitsIBM·Filed 2016·Granted Aug 22, 2017·4 cites·15 claims
- 0686US9401222B1Determining categories for memory fail conditionsIBM·Filed 2015·Granted Jul 26, 2016·9 cites·20 claims
- 0782US11262381B2Device for positioning a semiconductor die in a wafer proberIBM·Filed 2020·Granted Mar 1, 2022·2 cites·18 claims
- 0879US9927463B2Wafer probe alignmentIBM·Filed 2015·Granted Mar 27, 2018·2 cites·10 claims
- 0979US7650554B2Method and an integrated circuit for performing a testIBM·Filed 2006·Granted Jan 19, 2010·9 cites·14 claims
- 1078US12292472B2Testing a single chip in a wafer probing systemIBM·Filed 2023·Granted May 6, 2025·0 cites·23 claims
- 1177US9496188B2Soldering three dimensional integrated circuitsIBM·Filed 2015·Granted Nov 15, 2016·3 cites·19 claims
- 1274US9322848B2Ball grid array configuration for reliable testingGLOBALFOUNDRIES INC·Filed 2013·Granted Apr 26, 2016·2 cites·7 claims
- 1371US7636254B2Wordline booster circuit and method of operating a wordline booster circuitIBM·Filed 2007·Granted Dec 22, 2009·6 cites·15 claims
- 1470US11808808B2Testing a single chip in a wafer probing systemIBM·Filed 2021·Granted Nov 7, 2023·0 cites·25 claims
- 1570US8659310B2Method and system for performing self-tests in an electronic systemECKERT MARTIN·Filed 2011·Granted Feb 25, 2014·2 cites·20 claims
- 1667US6774656B2Self-test for leakage current of driver/receiver stagesIBM·Filed 2001·Granted Aug 10, 2004·13 cites·20 claims
- 1766US6725171B2Self-test with split, asymmetric controlled driver output stageIBM·Filed 2001·Granted Apr 20, 2004·12 cites·9 claims
- 1863US5485473AMethod and system for testing an integrated circuit featuring scan designFiled 1993·Granted Jan 16, 1996·27 cites·11 claims
- 1962US8866504B2Determining local voltage in an electronic systemECKERT MARTIN·Filed 2011·Granted Oct 21, 2014·1 cites·14 claims
- 2061US10288684B2On-chip hardware-controlled window strobingIBM·Filed 2017·Granted May 14, 2019·0 cites·9 claims
- 2161US10281527B2On-chip hardware-controlled window strobingIBM·Filed 2017·Granted May 7, 2019·0 cites·16 claims
- 2259US6127254AMethod and device for precise alignment of semiconductor chips on a substrateIBM·Filed 1998·Granted Oct 3, 2000·30 cites·9 claims
- 2358US10114914B2Layout effect characterization for integrated circuitsIBM·Filed 2017·Granted Oct 30, 2018·0 cites·15 claims
- 2458US9904748B1Layout effect characterization for integrated circuitsIBM·Filed 2017·Granted Feb 27, 2018·0 cites·14 claims
- 2557US10056346B2Chip attach frameIBM·Filed 2017·Granted Aug 21, 2018·0 cites·5 claims
- 2656US9709625B2Measuring power consumption in an integrated circuitECKERT MARTIN·Filed 2011·Granted Jul 18, 2017·1 cites·10 claims
- 2756US9686895B2Chip attach frameIBM·Filed 2013·Granted Jun 20, 2017·0 cites·6 claims
- 2854US11209479B2Stressing integrated circuits using a radiation sourceIBM·Filed 2019·Granted Dec 28, 2021·0 cites·20 claims
- 2953US8010934B2Method and system for testing bit failures in array elements of an electronic circuitIBM·Filed 2008·Granted Aug 30, 2011·2 cites·19 claims
- 3053US7921388B2Wordline booster design structure and method of operating a wordine booster circuitIBM·Filed 2007·Granted Apr 5, 2011·2 cites·10 claims
- 3152US9250289B2System for electrical testing and manufacturing of a 3-D chip stack and methodIBM·Filed 2013·Granted Feb 2, 2016·0 cites·13 claims
- 3249US9679665B2Method for performing built-in self-testsIBM·Filed 2014·Granted Jun 13, 2017·0 cites·15 claims
- 3347US11239152B2Integrated circuit with optical tunnelIBM·Filed 2019·Granted Feb 1, 2022·0 cites·11 claims
- 3447US10114069B2Method for electrical testing of a 3-D chip stackIBM·Filed 2015·Granted Oct 30, 2018·0 cites·4 claims
- 3545US9627090B1RAM at speed flexible timing and setup controlIBM·Filed 2015·Granted Apr 18, 2017·0 cites·8 claims
- 3645US9094306B2Network power fault detectionIBM·Filed 2013·Granted Jul 28, 2015·0 cites·11 claims
- 3743US11574695B1Logic built-in self-test of an electronic circuitIBM·Filed 2021·Granted Feb 7, 2023·0 cites·20 claims
- 3841US9627017B1RAM at speed flexible timing and setup controlIBM·Filed 2015·Granted Apr 18, 2017·0 cites·12 claims
- 3939US9620244B1Determining categories for memory fail conditionsIBM·Filed 2016·Granted Apr 11, 2017·0 cites·20 claims
- 4038US5369358AMethod of ensuring electrical contact between test probes and chip pads through the use of vibration and nondestructive deformationIBM·Filed 1992·Granted Nov 29, 1994·8 cites·13 claims
- 4135US2002043984A1Support carrier for temporarily attaching integrated circuit chips to a chip carrier and methodIBM·Filed 2001·Application pending·0 cites
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