Inventor · disambiguated record
Nadya Strelkova
Also filed as: STRELKOVA NADYA · STRELKOVA NADYA G
5 granted patents·88 citations·filing 2002–2005
81Inventor score
Files withLSI LOGIC CORP5
Top patents by PatentIndex Score
5 records- 0188US6775818B2Device parameter and gate performance simulation based on wafer image predictionLSI LOGIC CORP·Filed 2002·Granted Aug 10, 2004·57 cites·26 claims
- 0282US7434198B2Method and computer program product for detecting potential failures in an integrated circuit design after optical proximity correctionLSI LOGIC CORP·Filed 2005·Granted Oct 7, 2008·11 cites·16 claims
- 0380US7340706B2Method and system for analyzing the quality of an OPC maskLSI LOGIC CORP·Filed 2005·Granted Mar 4, 2008·7 cites·24 claims
- 0463US7325222B2Method and apparatus for verifying the post-optical proximity corrected mask wafer image sensitivity to reticle manufacturing errorsLSI LOGIC CORP·Filed 2004·Granted Jan 29, 2008·7 cites·18 claims
- 0559US7035446B2Quality measurement of an aerial imageLSI LOGIC CORP·Filed 2002·Granted Apr 25, 2006·6 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →