Inventor · disambiguated record
Steven H. Voldman
Also filed as: VOLDMAN STEVEN · VOLDMAN STEVEN H · VOLDMAN STEVEN HOWARD
265 granted patents·28 pending applications·7,474 citations·filing 1993–2018
99Inventor score
Top patents by PatentIndex Score
293 records- 0199US5656553AMethod for forming a monolithic electronic module by dicing wafer stacksIBM·Filed 1996·Granted Aug 12, 1997·355 cites·16 claims
- 0298US6433609B1Double-gate low power SOI active clamp network for single power supply and multiple power supply applicationsIBM·Filed 2001·Granted Aug 13, 2002·188 cites·19 claims
- 0398US5923067A3-D CMOS-on-SOI ESD structure and methodIBM·Filed 1997·Granted Jul 13, 1999·236 cites·9 claims
- 0497US5811857ASilicon-on-insulator body-coupled gated diode for electrostatic discharge (ESD) and analog applicationsIBM·Filed 1996·Granted Sep 22, 1998·167 cites·29 claims
- 0597US5629544ASemiconductor diode with silicide films and trench isolationIBM·Filed 1995·Granted May 13, 1997·202 cites·42 claims
- 0696US7535105B2Inter-chip ESD protection structure for high speed and high frequency devicesIBM·Filed 2005·Granted May 19, 2009·51 cites·19 claims
- 0796US7173310B2Lateral lubistor structure and methodIBM·Filed 2005·Granted Feb 6, 2007·49 cites·14 claims
- 0896US6232163B1Method of forming a semiconductor diode with depleted polysilicon gate structureIBM·Filed 1999·Granted May 15, 2001·136 cites·10 claims
- 0996US5943254AMultichip semiconductor structures with consolidated circuitry and programmable ESD protection for input/output nodesIBM·Filed 1997·Granted Aug 24, 1999·171 cites·21 claims
- 1096US5761009AHaving parastic shield for electrostatic discharge protectionIBM·Filed 1995·Granted Jun 2, 1998·88 cites·14 claims
- 1195US7129545B2Charge modulation network for multiple power domains for silicon-on-insulator technologyIBM·Filed 2005·Granted Oct 31, 2006·46 cites·8 claims
- 1295US6288426B1Thermal conductivity enhanced semiconductor structures and fabrication processesIBM·Filed 2000·Granted Sep 11, 2001·87 cites·32 claims
- 1395US5807791AMethods for fabricating multichip semiconductor structures with consolidated circuitry and programmable ESD protection for input/output nodesIBM·Filed 1997·Granted Sep 15, 1998·158 cites·12 claims
- 1494US8035190B2Semiconductor devicesIBM·Filed 2010·Granted Oct 11, 2011·15 cites·10 claims
- 1594US7242071B1Semiconductor structureIBM·Filed 2006·Granted Jul 10, 2007·30 cites·24 claims
- 1694US6574078B1Method and apparatus for providing electrostatic discharge protection of a magnetic head using a mechanical switch and an electrostatic discharge device networkIBM·Filed 2000·Granted Jun 3, 2003·43 cites·18 claims
- 1794US6015993ASemiconductor diode with depleted polysilicon gate structure and methodIBM·Filed 1998·Granted Jan 18, 2000·106 cites·15 claims
- 1894US5731945AMultichip semiconductor structures with consolidated circuitry and programmable ESD protection for input/output nodesIBM·Filed 1997·Granted Mar 24, 1998·126 cites·18 claims
- 1994US5587857ASilicon chip with an integrated magnetoresistive head mounted on a sliderIBM·Filed 1994·Granted Dec 24, 1996·64 cites·14 claims
- 2093US8054597B2Electrostatic discharge structures and methods of manufactureIBM·Filed 2009·Granted Nov 8, 2011·24 cites·16 claims
- 2193US6455902B1BiCMOS ESD circuit with subcollector/trench-isolated body mosfet for mixed signal analog/digital RF applicationsIBM·Filed 2000·Granted Sep 24, 2002·74 cites·25 claims
- 2293US6074899A3-D CMOS-on-SOI ESD structure and methodIBM·Filed 1999·Granted Jun 13, 2000·97 cites·9 claims
- 2392US10170476B2Structure and method of latchup robustness with placement of through wafer via within CMOS circuitryIBM·Filed 2017·Granted Jan 1, 2019·5 cites·19 claims
- 2492US8232625B2ESD network circuit with a through wafer via structure and a method of manufactureVOLDMAN STEVEN H·Filed 2009·Granted Jul 31, 2012·20 cites·22 claims
- 2592US7781292B2High power device isolation and integrationIBM·Filed 2007·Granted Aug 24, 2010·22 cites·20 claims
- 2692US6552879B2Variable voltage threshold ESD protectionIBM·Filed 2001·Granted Apr 22, 2003·37 cites·26 claims
- 2792US6294419B1Structure and method for improved latch-up using dual depth STI with impurity implantIBM·Filed 2000·Granted Sep 25, 2001·61 cites·17 claims
- 2892US6096584ASilicon-on-insulator and CMOS-on-SOI double film fabrication process with a coplanar silicon and isolation layer and adding a second silicon layer on one regionIBM·Filed 1998·Granted Aug 1, 2000·105 cites·10 claims
- 2992US5945713AElectrostatic discharge protection circuits for mixed voltage interface and multi-rail disconnected power grid applicationsIBM·Filed 1996·Granted Aug 31, 1999·100 cites·4 claims
- 3092US5703747AMultichip semiconductor structures with interchip electrostatic discharge protection, and fabrication methods thereforeFiled 1995·Granted Dec 30, 1997·118 cites·19 claims
- 3192US5644454AElectrostatic discharge protection system for MR headsIBM·Filed 1996·Granted Jul 1, 1997·67 cites·21 claims
- 3291US7750408B2Integrated circuit structure incorporating an inductor, a conductive sheet and a protection circuitIBM·Filed 2007·Granted Jul 6, 2010·19 cites·21 claims
- 3391US7671423B2Resistor ballasted transistorsIBM·Filed 2008·Granted Mar 2, 2010·19 cites·20 claims
- 3491US7541247B2Guard ring structures for high voltage CMOS/low voltage CMOS technology using LDMOS (lateral double-diffused metal oxide semiconductor) device fabricationIBM·Filed 2007·Granted Jun 2, 2009·17 cites·12 claims
- 3591US7498622B1Latchup robust gate array using through wafer viaIBM·Filed 2007·Granted Mar 3, 2009·23 cites·14 claims
- 3691US6710983B2ESD protection for GMR sensors of magnetic heads using SiGe integrated circuit devicesIBM·Filed 2002·Granted Mar 23, 2004·31 cites·35 claims
- 3791US6034388ADepleted polysilicon circuit element and method for producing the sameIBM·Filed 1998·Granted Mar 7, 2000·87 cites·15 claims
- 3891US5889293AElectrical contact to buried SOI structuresIBM·Filed 1997·Granted Mar 30, 1999·103 cites·9 claims
- 3991US5712747AThin film slider with on-board multi-layer integrated circuitIBM·Filed 1996·Granted Jan 27, 1998·57 cites·19 claims
- 4090US8859337B2Thermal matching in semiconductor devices using heat distribution structuresGAUL STEPHEN J·Filed 2010·Granted Oct 14, 2014·36 cites·10 claims
- 4190US7989306B2Method of forming alternating regions of Si and SiGe or SiGeC on a buried oxide layer on a substrateIBM·Filed 2007·Granted Aug 2, 2011·13 cites·5 claims
- 4290US7949983B2High tolerance TCR balanced high current resistor for RF CMOS and RF SiGe BiCMOS applications and cadenced based hierarchical parameterized cell design kit with tunable TCR and ESD resistor ballasting featureIBM·Filed 2008·Granted May 24, 2011·14 cites·6 claims
- 4390US6404269B1Low power SOI ESD buffer driver networks having dynamic threshold MOSFETSIBM·Filed 1999·Granted Jun 11, 2002·79 cites·36 claims
- 4490US6396107B1Trench-defined silicon germanium ESD diode networkIBM·Filed 2000·Granted May 28, 2002·63 cites·31 claims
- 4589US7401311B2Methodology for placement based on circuit function and latchup sensitivityIBM·Filed 2006·Granted Jul 15, 2008·16 cites·4 claims
- 4689US7303968B2Semiconductor device and method having multiple subcollectors formed on a common waferIBM·Filed 2005·Granted Dec 4, 2007·13 cites·4 claims
- 4789US7282771B2Structure and method for latchup suppressionIBM·Filed 2005·Granted Oct 16, 2007·13 cites·18 claims
- 4889US6429482B1Halo-free non-rectifying contact on chip with halo source/drain diffusionIBM·Filed 2000·Granted Aug 6, 2002·46 cites·18 claims
- 4989US6236103B1Integrated high-performance decoupling capacitor and heat sinkIBM·Filed 1999·Granted May 22, 2001·93 cites·13 claims
- 5089US6144086AStructure for improved latch-up using dual depth STI with impurity implantIBM·Filed 1999·Granted Nov 7, 2000·84 cites·26 claims
Showing the top 50 of 293 patent records by PatentIndex Score.
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