Inventor · disambiguated record
Kazuhiro Hotta
Also filed as: HOTTA KAZUHIRO
14 granted patents·3 pending applications·37 citations·filing 2005–2020
87Inventor score
Top patents by PatentIndex Score
17 records- 0187US7752594B2Semiconductor failure analysis apparatus, failure analysis method, failure analysis program, and failure analysis systemHAMAMATSU PHOTONICS KK·Filed 2006·Granted Jul 6, 2010·14 cites·19 claims
- 0277US11062458B2Appearance inspection device, transformation data generation device, and programDENSO CORP·Filed 2019·Granted Jul 13, 2021·4 cites·6 claims
- 0373US7865012B2Semiconductor failure analysis apparatus which acquires a failure observed image, failure analysis method, and failure analysis programHAMAMATSU PHOTONICS KK·Filed 2006·Granted Jan 4, 2011·4 cites·18 claims
- 0470US8047810B2Double-headed piston type compressorTOYOTA JIDOSHOKKI KK·Filed 2008·Granted Nov 1, 2011·3 cites·10 claims
- 0569US7805691B2Semiconductor failure analysis apparatus, failure analysis method, and failure analysis programHAMAMATSU PHOTONICS KK·Filed 2006·Granted Sep 28, 2010·6 cites·20 claims
- 0658US11181361B2Optical measurement method, optical measurement device, optical measurement program, and recording medium for recording optical measurement programHAMAMATSU PHOTONICS KK·Filed 2018·Granted Nov 23, 2021·0 cites·15 claims
- 0754US12094138B2Semiconductor inspection device and semiconductor inspection methodHAMAMATSU PHOTONICS KK·Filed 2020·Granted Sep 17, 2024·0 cites·10 claims
- 0854US9536300B2Image processing method, image processing system, and storage medium storing image processing programHAMAMATSU PHOTONICS KK·Filed 2014·Granted Jan 3, 2017·0 cites·13 claims
- 0953US9734571B2Image processing method, image processing system, and storage medium storing image processing programHAMAMATSU PHOTONICS KK·Filed 2014·Granted Aug 15, 2017·0 cites·26 claims
- 1052US12360056B2Semiconductor apparatus examination method and semiconductor apparatus examination apparatusHAMAMATSU PHOTONICS KK·Filed 2020·Granted Jul 15, 2025·0 cites·20 claims
- 1152US12211199B2Method for inspecting semiconductor and semiconductor inspecting deviceHAMAMATSU PHOTONICS KK·Filed 2020·Granted Jan 28, 2025·0 cites·14 claims
- 1249US12044729B2Semiconductor device examination method and semiconductor device examination deviceHAMAMATSU PHOTONICS KK·Filed 2020·Granted Jul 23, 2024·0 cites·20 claims
- 1347US11579184B2Analysis method, analysis device, analysis program, and recording medium for recording analysis programHAMAMATSU PHOTONICS KK·Filed 2018·Granted Feb 14, 2023·0 cites·15 claims
- 1443USD576179SPiston for compressorTOYOTA JIDOSHOKKI KK·Filed 2007·Granted Sep 2, 2008·6 cites·1 claims
- 1542US2007020781A1Semiconductor failure analysis apparatus, failure analysis method, and failure analysis programHAMAMATSU PHOTONICS KK·Filed 2006·Application pending·0 cites
- 1638US2005150706A1Fuel injection system and related structure for a four-wheeled saddle-type vehicleHONDA MOTOR CO LTD·Filed 2005·Application pending·0 cites
- 1737US2007290696A1Semiconductor failure analysis apparatus, failure analysis method, and failure analysis programHAMAMATSU PHOTONICS KK·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →