Inventor · disambiguated record
Yousuke Irie
Also filed as: IRIE YOUSUKE · IRIE YOUSUKE N
25 granted patents·2 pending applications·775 citations·filing 1993–2024
96Inventor score
Top patents by PatentIndex Score
27 records- 0197US5715121AMagnetoresistance element, magnetoresistive head and magnetoresistive memoryMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Feb 3, 1998·168 cites·20 claims
- 0295US11808657B2Stress distribution image processing devicePANASONIC IP MAN CO LTD·Filed 2021·Granted Nov 7, 2023·2 cites·12 claims
- 0395US5691936AMagnetoresistive element and memory elementMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Nov 25, 1997·126 cites·23 claims
- 0493US10830652B2Stress measurement device, stress measurement system, and stress measurement methodPANASONIC IP MAN CO LTD·Filed 2018·Granted Nov 10, 2020·8 cites·10 claims
- 0593US6903491B2Piezoelectric element, actuator, and inkjet headMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Jun 7, 2005·52 cites·6 claims
- 0693US6724580B2Actuator with piezoelectric memberMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Apr 20, 2004·55 cites·16 claims
- 0792US6111782AMagnetoresistance effect device, and magnetoresistance effect type head, memory device, and amplifying device using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Aug 29, 2000·55 cites·20 claims
- 0888US6400537B2Thin film magnetic headMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Jun 4, 2002·48 cites·7 claims
- 0987US6005798AMagnetoresistance effect device, and magnetoresistance effect type head, memory device, and amplifying device using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Dec 21, 1999·55 cites·22 claims
- 1085US5841611AMagnetoresistance effect device and magnetoresistance effect type head, memory device, and amplifying device using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Nov 24, 1998·86 cites·60 claims
- 1182US11467046B2Stress measurement method, stress measurement device, and stress measurement systemPANASONIC IP MAN CO LTD·Filed 2019·Granted Oct 11, 2022·2 cites·11 claims
- 1282US6256222B1Magnetoresistance effect device, and magnetoresistaance effect type head, memory device, and amplifying device using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Jul 3, 2001·28 cites·9 claims
- 1380US10900844B2Stress distribution measurement method and stress distribution measurement systemPANASONIC IP MAN CO LTD·Filed 2018·Granted Jan 26, 2021·3 cites·12 claims
- 1477US5459687AMemory elementMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1993·Granted Oct 17, 1995·39 cites·11 claims
- 1577US2024219175A1Thickness measurement method, thickness measurement device, defect detection method, and defect detection devicePANASONIC IP MAN CO LTD·Filed 2024·Application pending·0 cites
- 1674US6084752AThin film magnetic headMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Jul 4, 2000·23 cites·33 claims
- 1771US6943990B1Head support mechanism, information recording/reproducing apparatus, and method of manufacturing head support mechanismMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Sep 13, 2005·22 cites·68 claims
- 1864US11965735B2Thickness measurement method, thickness measurement device, defect detection method, and defect detection devicePANASONIC IP MAN CO LTD·Filed 2021·Granted Apr 23, 2024·0 cites·11 claims
- 1961US12092538B2Stress analysis device for moving bodyPANASONIC IP MAN CO LTD·Filed 2021·Granted Sep 17, 2024·0 cites·14 claims
- 2060US11761833B2Stress measurement device, stress measurement system, and stress measurement methodPANASONIC IP MAN CO LTD·Filed 2020·Granted Sep 19, 2023·0 cites·11 claims
- 2159US7507297B2Cleaning method and cleaning apparatusPANASONIC CORP·Filed 2003·Granted Mar 24, 2009·3 cites·13 claims
- 2255US12073549B2Stress analysis devicePANASONIC IP MAN CO LTD·Filed 2022·Granted Aug 27, 2024·0 cites·8 claims
- 2353US11906370B2Stress distribution measurement method and stress distribution measurement systemPANASONIC IP MAN CO LTD·Filed 2020·Granted Feb 20, 2024·0 cites·3 claims
- 2446US12066343B2Stress properties measurement method, device, and system correlated based on stress gradients on multiple regionsPANASONIC IP MAN CO LTD·Filed 2021·Granted Aug 20, 2024·0 cites·7 claims
- 2546US11275005B2Fatigue limit stress specification system, fatigue limit stress specification device, and fatigue limit stress specification methodPANASONIC IP MAN CO LTD·Filed 2019·Granted Mar 15, 2022·0 cites·6 claims
- 2638US2005094931A1Optical switch and production method therefor, information transmission device using itFiled 2003·Application pending·0 cites
- 2734US11054252B2Thickness measurement method, thickness measurement device, defect detection method, and defect detection devicePANASONIC IP MAN CO LTD·Filed 2018·Granted Jul 6, 2021·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →