Inventor · disambiguated record
Han-Liang Tseng
Also filed as: TSENG HAN-LIANG
22 granted patents·2 pending applications·188 citations·filing 1995–2021
93Inventor score
Top patents by PatentIndex Score
24 records- 0185US10651218B1Optical sensor structure and method for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2019·Granted May 12, 2020·4 cites·20 claims
- 0280US5530418AMethod for shielding polysilicon resistors from hydrogen intrusionTAIWAN SEMICONDUCTOR MFG·Filed 1995·Granted Jun 25, 1996·63 cites·22 claims
- 0373US6001540AMicrolens processTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Dec 14, 1999·45 cites·20 claims
- 0472US5949547ASystem for in-line monitoring of photo processing in VLSI fabricationTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Sep 7, 1999·37 cites·7 claims
- 0571US10699092B2Optical sensor and manufacturing method thereofVANGUARD INT SEMICONDUCT CORP·Filed 2018·Granted Jun 30, 2020·1 cites·20 claims
- 0669US11989966B2Semiconductor devices and methods for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2021·Granted May 21, 2024·0 cites·19 claims
- 0764US10935805B2Optical sensor and method for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2019·Granted Mar 2, 2021·1 cites·19 claims
- 0863US11271024B2Semiconductor device and method for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2019·Granted Mar 8, 2022·0 cites·20 claims
- 0962US11177397B2Semiconductor devices and methods for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2020·Granted Nov 16, 2021·0 cites·16 claims
- 1062US8049323B2Chip holder with wafer level redistribution layerTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Nov 1, 2011·2 cites·15 claims
- 1160US11152422B2Semiconductor devices and methods for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2019·Granted Oct 19, 2021·0 cites·15 claims
- 1258US6004864AIon implant method for forming trench isolation for integrated circuit devicesTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Dec 21, 1999·23 cites·22 claims
- 1357US10915727B2Optical sensor and method for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2018·Granted Feb 9, 2021·0 cites·24 claims
- 1454US11315964B2Optical sensors and methods for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2019·Granted Apr 26, 2022·0 cites·16 claims
- 1553US10770602B1Optical sensor and method for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2019·Granted Sep 8, 2020·0 cites·19 claims
- 1651US11621287B2Optical sensor device with reduced thickness and method for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2020·Granted Apr 4, 2023·0 cites·21 claims
- 1750US11482552B2Semiconductor devices and methods for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2019·Granted Oct 25, 2022·0 cites·19 claims
- 1850US11049771B2Semiconductor device and fingerprint identification deviceVANGUARD INT SEMICONDUCT CORP·Filed 2018·Granted Jun 29, 2021·0 cites·10 claims
- 1950US6710889B2Method for improved dielectric layer metrology calibrationTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Mar 23, 2004·6 cites·20 claims
- 2044US7662665B2Method for fabricating a semiconductor package including stress relieving layer for flip chip packagingTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Feb 16, 2010·0 cites·19 claims
- 2143US10763288B1Semiconductor device and method for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2019·Granted Sep 1, 2020·0 cites·19 claims
- 2239US5990567ASystem for in-line monitoring of photo processing tilt in VLSI fabricationTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Nov 23, 1999·6 cites·14 claims
- 2338US2019386048A1Semiconductor device and method for forming the sameVANGUARD INT SEMICONDUCT CORP·Filed 2018·Application pending·0 cites
- 2435US2003230323A1Apparatus and method for improving scrubber cleaningTAIWAN SEMICONDUCTOR MFG·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →